Synopsys introduces first wave of Multiphysics Fusion solutions
Series 20 – Episode 8 – current changes and new challenges in the automotive industry
Duo combine to enhance ADAS sensor test

Series 20 – Episode 8 – current changes and new challenges in the automotive industry

Series 20 – Episode 8 – current changes and new challenges in the automotive industry Series 20 – Episode 8 – current changes and new challenges in the automotive industry
This entry is part 3 of 31 in the series Electronic Specifier Insights

The latest episode of Electronic Specifier Insights, hosted by Paige Hookway, features Frank Mayer, General Manager of imc Test & Measurement, in a discussion about how test and measurement practices are evolving to meet the demands of electrification, software-defined vehicles, and advanced driver-assistance systems (ADAS).

Drawing on decades of industry experience, Mayer frames the challenge as one of preserving signal integrity while scaling measurement, storage, and analysis to handle vastly more data.

A central theme of the interview is complexity: modern vehicles embed thousands of sensors, multiple bus systems, and high-voltage subsystems, and test infrastructures must keep pace. Mayer stresses the leap in measurement scope: where engineers once managed a few dozen signals, “suddenly they have to measure 1000s of different data sets.” He underlines the safety implications of missing rare, transient events: even a one-second anomaly can create a safety hazard, so capturing, storing, and analysing high-bandwidth data in real time is essential.

On the meaning of “real time,” Mayer cautions against one-size-fits-all definitions. “When we say real time, that doesn’t always mean it’s just the same millisecond,” he explains, noting that some automotive use cases accept latencies like 100 milliseconds, while sensor-driven systems can demand much faster insights. The goal, he says, is to be able to “look at the real data immediately when it happens” while still performing post-processing for deeper analysis.

To address synchronisation and integrity across hundreds of channels, imc emphasises engineering discipline and localised data handling. Mayer describes the company’s approach: “we do it at our amplifier already,” storing data close to the device-under-test to avoid the bottlenecks and integrity issues of transporting large volumes of raw data across networks. Short cabling, careful signal handling, and a high-speed backplane between amplifier and base unit all help ensure timing and fidelity.

imc positions itself as an end-to-end provider that blends analog expertise with modern software orchestration. Mayer highlights a multi-core software approach that separates command and control from data acquisition tasks – ensuring deterministic behaviour in complex setups – and points to integrated AI features that help sift large volumes of measurement data. “It makes it easier to find the challenge, find the issue in all of this,” he says, describing how AI tools shorten the time from capture to insight.

The conversation digs into two flagship software products: IMC Studio and FAMOS. Mayer clarifies their complementary roles: “Studio is used for really getting access to our magic data acquisition world at imc … you don’t have to be a programmer,” offering an intuitive environment for configuring tests, automating calibration, and managing workflows. FAMOS, by contrast, is described as a powerful post-analysis suite with AI capabilities that can ingest data from oscilloscopes, spectrum analysers, and other DAQ systems.

On predictive maintenance and AI, Mayer is pragmatic. He stresses that tools are enablers, while domain experts generate the real value: “The power comes from the gurus … who are doing actually their own design.” A striking example Mayer shares involves a customer who used FAMOS to build predictive models for safety-relevant electronics in nuclear power plant systems – demonstrating how high-quality measurement data plus expert modelling can produce actionable maintenance forecasts.

Looking ahead, Mayer is cautiously optimistic about AI’s role in test engineering. He believes AI will take over tedious data wrangling and accelerate engineers’ workflows but insists on human oversight: “You always have to look over those results,” he warns, emphasising that creativity and contextual judgement remain human strengths. For Mayer, the future of test and measurement is not autonomous decision-making by software but a partnership where intelligent tools augment experienced engineers.

To hear more from Frank Mayer, you can listen to Electronic Specifier’s interview on Spotify or Apple podcasts.

Electronic Specifier Insights

Series 20 – Episode 9 – the industrial automation landscape Series 20 – Episode 7 – How is NTN reshaping connectivity?

Electronic Specifier Insights

Series 20 – Episode 10 – audio industry insights and innovations

Series 20 – Episode 10 – audio industry insights and innovations

Series 20 – Episode 9 – the industrial automation landscape

Series 20 – Episode 9 – the industrial automation landscape

Series 20 – Episode 8 – current changes and new challenges in the automotive industry

Series 20 – Episode 8 – current changes and new challenges in the automotive industry

Series 20 – Episode 7 – How is NTN reshaping connectivity?

Series 20 – Episode 7 – How is NTN reshaping connectivity?

Series 20 – Episode 6 – The heart of the software-defined vehicle

Series 20 – Episode 6 – The heart of the software-defined vehicle

Series 20 – Episode 5 – Pushing AI to the Edge

Series 20 – Episode 5 – Pushing AI to the Edge

Series 20 – Episode 4 – Are reed relays a thing of the past?

Series 20 – Episode 4 – Are reed relays a thing of the past?

Series 20 – Episode 3 – Resilient and adaptable leadership

Series 20 – Episode 3 – Resilient and adaptable leadership

Series 20 – Episode 2 – emApps: smartphone-like flexibility for embedded systems

Ruth Gray - headshot - Electronic Specifier Insights

Series 20 – Episode 1 – The Women in Tech supply chain

Electronic Specifier’s top podcasts of 2025

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Series 19 – Episode 10 – why DigiKey focuses on automation & control products

Series 19 – Episode 9 – AI at the industrial Edge

Series 19 – Episode 9 – AI at the industrial Edge

Series 19 – Episode 8 – power system reliability starts with isolation

Series 19 – Episode 8 – power system reliability starts with isolation

Series 19 - Episode 7: DigiKey's Back2School Giveaway

Series 19 – Episode 7 – DigiKey’s Back2School Giveaway

Series 19 – Episode P6 – securing designs with tamper detection & prevention

Series 19 – Episode 6 – securing designs with tamper detection & prevention

S19 - EP5 - accelerating Edge AI infrastructure for predictive and Generative AI

S19 – Episode 5 – accelerating Edge AI infrastructure for predictive and Generative AI

Series 19 – Episode 4 – reed relays for the new space era

Series 19 – Episode 4 – reed relays for the new space era

Series 19 – Episode 3 – Arm-ing the software-defined car

Series 19 – Episode 3 – Arm-ing the software-defined car

Series 19 – Episode 2 – infrared starter kit for university and commercial R&D

Series 19 – Episode 2 – infrared starter kit for university and commercial R&D

Series 19 – Episode 1 – Women in Tech takeover: A CEO mindset

Series 19 – Episode 1 – Women in Tech takeover: A CEO mindset

Series 18 – Episode 10 – Women in tech takeover: an AI mindset

Series 18 – Episode 10 – Women in tech takeover: an AI mindset

In this special Women in Tech takeover, Sheryl Miles speaks with Jeana Bolanos, Founder and President, SalesE about her unique career journey from nuclear engineer in the US Navy to semiconductor industry professional and now tech entrepreneur.

Series 18 – Episode 9 – Nanusens’ new approach to MEMS integration

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Paige West speaks with Dr Josep Montanyà i Silvestre, CEO at Nanusens about the company’s MEMS-in-CMOS technology.

Series 18 – Episode 8 – optimising Edge AI with low-power FPGAs

Series 18 – Episode 8 – optimising Edge AI with low-power FPGAs

Paige West speaks with Hussein Osman, Marketing Director, Lattice Semiconductor about the company’s role in enabling Edge AI.

Series 18 – Episode 7 – modern manufacturing needs modern profiling

Series 18 – Episode 7 – modern manufacturing needs modern profiling

Paige West speaks with Chris Williams, Head of European Sales, Solderstar about thermal profiling.

Series 18 – Episode 6 – memory at the core of innovation

Series 18 – Episode 6 – memory at the core of innovation

Paige West speaks with Steve Shih, Automotive and Embedded Product Manager, Silicon Motion about memory being at the core of innovation and, in particular, how it’s transforming the industrial and automotive sectors.

Series 18 – Episode 5 – re-launch of the Systems Change Lab

Series 18 – Episode 5 – re-launch of the Systems Change Lab

Paige West speaks with Ellie Carey, Elected Trustee at Engineers Without Borders UK and Eva Fernandez, Strategic Sustainability Consultant at Ramboll about the launch of the 2025 Systems Change Lab.

Series 18 – Episode 4 – shaping IoT's next chapter with antenna innovation

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Paige West speaks with Dermot O'Shea, Co-Founder and CEO, Taoglas about the Internet of Things (IoT) and antenna innovation.

Series 18 – Episode 3 – security for embedded systems

Series 18 – Episode 3 – security for embedded systems

Paige West speaks with Roland Marx, Product Manager, swissbit about the critical world of cybersecurity and swissbit’s Security Upgrade System.

Series 18 – Episode 2 – PXI, LXI, & the modular test puzzle: finding the right fit

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Paige West speaks with Tom Sarfi, Business Development Manager, Pickering Interfaces about the differences between LXI & PXI and where each is best suited.

Series 18 – Episode 1 – the future of battery management

Series 18 – Episode 1 – the future of battery management

Paige West speaks with Joseph Notaro, Vice President Global Sales & Marketing, Dukosi about its cell monitoring system, the DKCMS with C-Synq.

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