Downloadable firmware that enables all MPT3000 systems to test Serial Attached SCSI (SAS) 12G and Serial ATA (SATA) 6G solid-state drives (SSDs) has been released by Advantest. The company says that it makes the tester the first true single-system solution for testing SAS, SATA and PCIe protocol SSDs.

A full range of test solutions designed to enable the Internet of Things (IoT) including automatic test equipment (ATE), terahertz measurement systems, multi-vision scanning-electron microscopes (SEM) and an e-beam lithography system will be demonstrated by Advantest at SEMICON West 2015 in San Francisco (July 14-16).

The VOICE 2015 Developer Conference organised by Advantest became a truly international forum last month by holding the event in both Santa Clara, California and Shanghai, China – the first time that this annual gathering of test equipment users, suppliers and partners has been held outside the United States.

The new T5833 system from Advantest is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Shipments to customers are beginning this month. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater d...

A technology that utilises short-pulse terahertz waves for analysis of electrical circuits has been developed by Advantest. The technology has 2 major applications – analysis of the transmission characteristics (S parameters) of devices using the sub-terahertz band (100GHz~1THz), and characterisation and location of failures in chip circuits (TDT/TDR).

Advantest’s annual VOICE Developer Conference kicks off on May 12 in Silicon Valley, California and May 22 in Shanghai, China. VOICE will include technical presentations, a partners’ expo, and interactive discussion sessions for users of the V93000 and T2000 SoC test platforms, as well as Advantest handlers and test cell solutions, offering extensive learning and networking opportunities for all attendees.

Advantest will showcase its broad product portfolio, including its semiconductor test solutions, nanotechnology products and terahertz systems at SEMICON China (March 17-19) The show will be held at the Shanghai New International Expo Centre.

Advantest will showcase its CloudTesting solutions from its group company, Cloud Testing Service at DATE 2015 at the ALPEXPO-ALPES Congress in Grenoble (March 9-13).  Backed by Advantest’s 60-year history of measurement technology and innovation, CTS solutions offer the latest high-quality test methods utilising IPs, characterization tools, analysis and more.

Advantest has combined improved positioning accuracy higher throughput and tighter temperature control in its new M6245 test handler. The system incorporates the company’s latest advances for handling double data rate (DDR) and Flash memory devices. The test handler incorporates a visual-alignment system that improves test yields by achieving contact accuracy to within 0.3 mm ball pitch.

Advantest has launched a new multi-purpose parametric measurement unit (PMU) module, the T2000 PMU32E, to enhance its T2000 platform’s capabilities in testing digital, analogue and power-management system-on-chip (SoC) devices. The new high-density, 32-channel module is fully compatible with Advantest’s original PMU32 module – even using the same tester interface unit (TIU) – while offering twice the resolution and accurac...

There are three key trends in testing the next generation of display driver ICs that control high resolution LCD panels, and Advantest has launched its new T6391 system to meet these requirements. The new tester will address the growing number of pins on display driver devices, the increasing speeds of interfaces and highly integrated multi-functions – all of which contribute to higher resolution displays.

Advantest is preparing to exhibit its broad portfolio, including its nanotechnology products, terahertz systems and semiconductor test solutions at SEMICON Europa in Grenoble (October 7-9).  It will highlight its multi-vision CD-SEM metrology solutions and newest e-beam lithography tool.

Advantest has extended the capabilities of its V93000 test platform for high-voltage and high-current testing of embedded power devices. It has launched the PVI8 floating power source, which gives the V93000 sufficient power and enough analogue and digital channels on a single platform to conduct highly parallel, cost-efficient testing of embedded power ICs.

Advantest has announced its new T2000 Enhanced Device Power Supply 150A (DPS150AE) module that enables its T2000 test platform to handle the load requirements for highly accurate testing of both high-current and low-voltage semiconductors, including microprocessor units (MPUs), application-specific ICs (ASICs) and field-programmable gate arrays (FPGAs).

Advantest has unveiled the first member of its NEO-SSD family of products for testing advanced solid-state drives (SSDs). The MPT3000 system enables accelerated SSD product development and faster time-to-manufacturing ramp. The system improves users’ engineering efficiency through powerful, easy to use software tools and a multi-protocol hardware architecture.

A 1.6 GBit per second digital module from Advantest incorporates a new feature called Functional Test Abstraction Plus (FTA+) to achieve protocol-aware testing in which the tester communicates directly with the devices under test (DUT) in each IC’s protocol language. Advantest says that the T2000 digital module will improve efficiency in testing system-on-chip (SoC) devices on the T2000 test platform.

An evolutionary value-added platform that combines digital and analogue testing capabilities to handle small-pin-count analogue, mixed-signal and sensor semiconductors has been unveiled by Advantest.  The EVA100’s expandable architecture provides the flexibility to conduct a wide range of measurement functions.

Advantest’s terahertz power meter, the TAS5500 is a basic measurement instrument that computes the strength of terahertz waves by detecting the heat generated when these waves are absorbed by matter. This enables input power to be measured to ±8% accuracy.The measurement accuracy is based on the Japanese national standard for infrared power measurement, recalibrated for the terahertz region with measurement data accumulated by Advant...

Advantest has extended its V93000 capabilities with the DPS128HV module, a high-density device power supply (DPS) unit designed to handle a wide range of operating voltages for testing devices such as eFlash memory ICs. With the new module, Advantest’s V93000 test platform can be easily scaled from low-channel to high-channel configurations to provide the most economical test solution for each specific device under test.

VOICE, the annual developer conference hosted by Advantest, will continue its tradition of offering a dynamic technical program in 2014 with a record number of papers presented in two locations – May 12-13 in Silicon Valley, California at the Hyatt Regency Santa Clara, and May 15-16 in Austin, Texas at the Radisson Hotel & Suites Austin Downtown.