Advantest Europe GmbH

Address:
Stefan-George-Ring 2



81929 München
Germany

Phone: +49-89-99312-131

Fax: +49-89-99312-108

Web: https://www.advantest.com/


Advantest Europe GmbH articles

Displaying 1 - 20 of 113

Two modules and a test head enhance SoC test platform

Two modules and a test head enhance SoC test platform
Two new modules and a test head designed specifically for high-volume testing of devices used in automotive applications have been added to Advantest’s T2000 platform. The new equipment is designed to enhance test coverage, enable higher parallelism and reduce the cost of test for system-on-chip (SoC) devices used in automobiles, a market segment that is projected to have a 9.6% compound annual growth rate from 2019 to 2022.
15th October 2019

Alternative silicon validation on show at RADECS 2019

CloudTesting Services (CTS) will be featured by Advantest at RADECS 2019, the annual European forum for presenting and discussing the latest advances in the field of radiation effects on electronic and photonic materials, devices, circuits, sensors and systems.
13th September 2019

Memory test solution to feature at Flash Summit 2019

Storage and memory test solutions, including the debut of its MPT3000ARC test system will be showcased at Flash Memory Summit 2019 in Santa Clara, California (August 6-8).
30th July 2019


Tester accommodates a wide range of SSD form factors

Developed to test and debug solid-state drives (SSD), the MPT3000ARC system is the newest member of Advantest’s MPT3000 product family. The fully integrated MPT3000ARC can operate over a broad temperature range to test all SSDs used in rapidly multiplying applications, including connected devices from smart cars to wearable electronics.
24th July 2019

Software bridges route from DfT to ATE

Software bridges route from DfT to ATE
A software bridge, dubbed SmartShell has been introduced by Advantest to enable direct communication between any of its V93000 single scalable platform testers and electronic design automation (EDA) environments such as Tessent Silicon Insight software from Mentor.
13th May 2019

5G test services to feature at Kuala Lumpur show

Products and services enabling the development of 5G technology will be featured by Advantest at SEMICON Southeast Asia in Kuala Lumpur (May 7-9). Live product demonstrations and digital graphics will showcase its IC test solutions.
2nd May 2019

Keynote speakers announced for VOICE 2019

The technical program and complete list of keynote speakers for both locations of Advantest’s VOICE 2019 Developer Conference have been finalised. For the first time, the conference will be held in Scottsdale, Arizona (May 14-15) and Singapore (May 23) under the unifying theme "Measure the Connected World and Everything in It.”
3rd April 2019

Silicon test solution set for DATE in Florence

Semiconductor test equipment supplier Advantest will showcase its CloudTesting Services (CTS) at DATE 2019 in Florence (March 26-28). The annual conference combines a world-class technical program with an international exhibition of electronic design automation and test technologies.
21st March 2019

SEMICON China to feature AI test solution

Semiconductor test equipment supplier Advantest will demonstrate and present a technical paper on its V93000 artificial intelligence (AI) test solution for the diverse and fast-growing AI and high-performance computing markets during SEMICON China in Shanghai (March 20-22) The V93000 Single Scalable Platform is already in widespread use at major AI chip designers around the world including China’s leading AI fabless companies.
11th March 2019

Advantest closes acquisition on renegotiated terms

Semiconductor test equipment supplier Advantest has closed its acquisition of the commercial Semiconductor System Level Test business (“Test Systems”), from Astronics on renegotiated terms due to a change in business conditions related to the semiconductor industry and Test Systems business.
14th February 2019

Semiconductor test solutions enabling 5G connectivity

Semiconductor test solutions enabling 5G connectivity
Semiconductor test equipment supplier Advantest Corporation has announced that it will feature its wide range of solutions for advanced IC testing and wafer metrology at SEMICON Korea on January 23rd to 25th at COEX in Seoul, South Korea. Among the products that Advantest will feature in booth #C510 in Hall C are systems and enhancements that the company has recently announced.
15th January 2019

Keynote speakers unveiled for VOICE 2019

Registration has opened for Advantest's VOICE 2019 Developer Conference, along with the announcement of the full keynote speaker line up for the US program. The conference will be held in two new locations – Scottsdale, Arizona on May 14-15 and Singapore on May 23 – under the unifying theme “Measure the Connected World and Everything in It”.
2nd January 2019

Experiment confirms high-speed potential of STT-MRAM

Experiment confirms high-speed potential of STT-MRAM
A collaboration between Advantest and Tohoku University’s Center for Innovative Integrated Electronic Systems led by Tetsuo Endoh has successfully demonstrated operation of a high-writing-speed spin-transfer torque magnetic random access memory (STT-MRAM) using an Advantest memory test system.
5th December 2018

Memory tester meets 5G chip needs

The T5851 STM16G memory tester from Advantest is for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
27th November 2018

Cloud-based test service on parade at electronica

Measurement tools and solutions for automotive, communications and consumer devices will be showcased by Advantest at electronica in Munich, Germany (13-16 November). Visitors will be able to attend demonstrations of the on-demand CloudTesting Service, and see the latest capabilities of its EVA100 analogue/mixed-signal IC Test solution and theV93000 A-Class SoC test system for device engineering and production, as well as its HA7300 stimulus test cell for differential pressure sensors.
7th November 2018

Duo develop STT-MRAM testing module

Duo develop STT-MRAM testing module
A collaboration between Advantest and Tohoku University’s Center for Innovative Integrated Electronic Systems (pictured), led by Tetsuo Endoh has successfully developed a high-speed, high-precision module that can measure the switching currents in the memory arrays of spin-transfer torque magnetic random access memory (STT-MRAM) in units of microamperes and nanoseconds, using an Advantest memory test system.
31st October 2018

VOICE 2019 opens Call for Papers

Advantest has opened the call for papers for the international VOICE 2019 Developer Conference, focusing on innovative test solutions and best practices using the V93000 and T2000 system-on-chip (SoC) test platforms as well as Advantest memory testers and handler solutions.
9th October 2018

Smart Scale Tester for upcoming generation of server processors

Smart Scale Tester for upcoming generation of server processors
  Semiconductor test equipment supplier, Advantest Corporation, has installed its 3,000th V93000 Smart Scale test system for use by its long-term customer AMD, in evaluating AMD Ryzen, AMD Radeon and AMD EPYC compute, graphics and data centre products.
4th October 2018

Expanded global attendance breaks conference records

The VOICE 2018 Developer Conference staged by Advantest has set new records with 177 submitted abstracts representing contributions from 13 countries. In addition to more than 90 technical presentations, VOICE 2018 featured informative Partners’ Expos, highly rated keynote speakers, 25 interactive technology kiosks and multiple networking opportunities.
4th September 2018

Holistic test solution streamlines SSD transition

A fully integrated test solution for developing, debugging and mass producing PCIe Gen 4 solid-state drives (SSD) has been launched by Advantest on the MPT3000 platform. This is the same tester used by manufacturers of PCIe Gen 3, SATA and SAS SSDs. The all-inclusive test solution enables SSD manufacturers to accelerate their newest products’ time to market.
2nd August 2018


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