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Advantest Europe GmbH Articles

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5th December 2012
VOICE 2013 User’s Conference for SoC & Memory Semiconductor Devices & Handler Test Technologies

VOICE 2013 is an international conference focusing on innovative test solutions for system-on-chip and memory semiconductor devices and handler solutions. The 2013 conference will include technical presentations, new product kiosks, interactive discussion sessions for users of the T2000, V93000 and memory test platforms and test cell solutions, offering extensive networking and learning opportunities for all attendees. A new addition to the progr...

Test & Measurement
27th November 2012
Advantest's T2000 8-Gbps Digital Module for High-Speed Testing of SoCs

Advantest has introduced its new T2000 8GDM to address the test requirements of system-on-chip devices with high-speed serial, parallel and memory interfaces such as PCI-Express and double data rate connections. The new module will be featured in Advantest’s exhibit (booth #8C-901 in Hall 8) at the SEMICON Japan trade show, December 5-7 in Makuhari Messe in the Chiba prefecture.

Test & Measurement
26th November 2012
Advantest Introduces New Wafer MVM-SEM Tool E3310

Advantest Corporation has introduced its new Multi-Vision Metrology Scanning Electron Microscope, the Wafer MVM-SEM E3310, which measures fine-pitch patterns on a wide range of wafer types with unparalleled accuracy, utilizing Advantest’s proprietary electron beam scanning technology.

14th November 2012
Advantest Develops EB Lithography System for 1Xnm Node

Advantest has announced that it has developed a new EB (electron beam) lithography system, the F7000, with superior resolution performance meeting the requirements for 1Xnm technology nodes. The F7000 supports substrates of diverse materials, sizes, and shapes, including nanoimprint templates as well as wafers, and is optimized for diverse applications such as advanced LSIs, photonics, MEMS, and other nano-processes.

Test & Measurement
8th November 2012
Advantest Introduces T2000 IMS for Low-Cost Testing of Integrated Microcontroller and Smart Card ICs

Advantest has introduced its new T2000 Integrated Massive Parallel test solution (IMS), a massive parallel test system capable of achieving the lowest cost of test for microcontroller units with integrated analog and embedded flash memory circuits.

Automotice Microsite
1st August 2012
Advantest remporte le Prix du Meilleur Fournisseur remis par STATS ChipPAC

Premier fournisseur de bancs de test pour semiconducteurs, Advantest Corporation s'est vue décerner le Prix du Meilleur Fournisseur par la société STATS ChipPAC Ltd. (SGX-ST : STATSChP), l'un des premiers prestataires en solutions d'emballage, d'assemblage, de tests et de distribution de semiconducteurs. C’est la cinquième année consécutive qu’Advantest est distinguée par cette reconnaissance.

Test & Measurement
27th July 2012
500th V93000 Port Scale RF Tester shipped by Advantest

Advantest has announced today that it has installed its 500th V93000 Port Scale RF test system, with the landmark unit going into the engineering development laboratory of Spreadtrum Communications. Spreadtrum has begun using the versatile tester, which is equipped with both a Pin Scale 1600 digital card and a MB-AV8+ analog card, to develop semiconductor products for mobile phone applications, including RF-based system-on-chip and 3G baseband de...

27th July 2012
STATS ChipPAC names Advantest as Best Supplier

Advantest has today announced that it has received a Best Supplier Award from Singapore-based STATS ChipPAC. This is the fifth consecutive year that Advantest has earned this supplier accolade. STATS ChipPAC’s Best Supplier Award recognizes materials and equipment suppliers for overall best-in-class performance in cost, quality, delivery, technology, service and support.

6th July 2012
Advantest and JEM Receive Best Overall Presentation Award at IEEE SWTW 2012

Advantest Corporation declared today that the company received the Best Overall Presentation Award at the 22nd Annual IEEE Semiconductor Wafer Test Workshop for a joint presentation with leading probe card manufacturer JEM. SWTW 2012 was held June 10 - 13, 2012, in San Diego, CA, USA.

Test & Measurement
6th July 2012
Advantest Introduces Industry’s Highest Capability 3-in-1 Semiconductor Test Clock Module to Improve Yields and Save Time & Money in Testing High-Speed ICs

Advantest Corporation have introduced the new T2000 LJC16 16-channel, low-jitter-clock module. The LJC16 module, which combines different digital clock and analog clock/sine-wave requirements in a single high-multi-site system, will be featured in Advantest’s booth (#6247 in North Hall) at the SEMICON West trade show, July 10-12 in San Francisco.

4th July 2012
Advantest Breaks Ground for Cheonan, S. Korea Factory

Advantest today announced that its South Korean subsidiary, Advantest Korea broke ground on June 28 for its new factory in Cheonan City, Chungnam Province, South Korea.

Test & Measurement
20th June 2012
Hua Hong NEC Advantest Co-Develop Wafer-Level High Parallelism Multi-Site Test Solution RFID Devices

Shanghai Hua Hong NEC Electronics Company, Ltd. and Advantest Corporation have collaborated to successfully develop a wafer-level, multi-site parallel test solution for radio-frequency identification semiconductor devices that meet industry-standard ISO 14443 guidelines.

Test & Measurement
6th June 2012
Advantest Announces 3D TSV Stack Test Solutions

Advantest Corporation today announced that a new product line of fully automated and integrated test and handling solutions for TSV based 2.5D and 3D products is under development. The concept model test cell dubbed, DIMENSION, integrates a high parallel test cluster along with singulated die and 3D die stack automated handling capabilities.

Test & Measurement
6th June 2012
Advantest Announces Memory Test System T5811

Advantest Corporation today announced its new memory test system, the T5811, targeting DRAM memory core test. Available from July 2012, the T5811 reduces power consumption by 90% and floor-space requirements by two-thirds, compared to previous models, and is upgradable via a simple exchange of components.

Test & Measurement
6th June 2012
Advantest to Launch CloudTesting Service in Fall 2012

Advantest Corporation today announced that it will launch a new test solution, dubbed CloudTesting Service (CTS), which utilizes cloud computing technology to offer cutting-edge test technology for semiconductor device R&D and design applications.

Test & Measurement
31st May 2012
Advantest Ships 100th V93000 Smart Scale Test System in Product Line’s First 10 Months

Just ten months after launching its Smart Scale generation of testers, Advantest Corporation has shipped its 100th V93000 Smart Scale system, capable of scalable, highly cost-efficient testing of IC designs for the 28 nm technology node and beyond.

30th May 2012
Advantest Expo 2012 Visit the Leading Edge of the Future

Advantest Corporation today announced that its quadrennial corporate exhibition, Advantest Expo 2012, will be held at the Tokyo International Forum on June 6th—7th, 2012. The event will showcase Advantest’s present and future with numerous tools and equipment displays, as well as keynote speeches and seminars exploring the diverse sectors where Advantest has a presence. Attendance is expected to include the general public as well as industry ...

Test & Measurement
15th May 2012
Advantest Introduces T5511 High-Speed Memory Test System Offering Multi-functionality and Industry’s Top Test Speed of 8Gbps

Advantest Corporation announced the availability of its next-generation high-speed DRAM test system, the T5511. The new system, which begins shipping this month, offers the industry’s fastest test speed of 8Gbps.

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