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Advantest Europe GmbH

Advantest Europe GmbH Articles

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Test & Measurement
14th March 2014
Power supply unit extends memory IC test options

Advantest has extended its V93000 capabilities with the DPS128HV module, a high-density device power supply (DPS) unit designed to handle a wide range of operating voltages for testing devices such as eFlash memory ICs. With the new module, Advantest’s V93000 test platform can be easily scaled from low-channel to high-channel configurations to provide the most economical test solution for each specific device under test.

Events News
12th March 2014
Advantest VOICE 2014 Conference to feature more than 100 papers

VOICE, the annual developer conference hosted by Advantest, will continue its tradition of offering a dynamic technical program in 2014 with a record number of papers presented in two locations – May 12-13 in Silicon Valley, California at the Hyatt Regency Santa Clara, and May 15-16 in Austin, Texas at the Radisson Hotel & Suites Austin Downtown.

Test & Measurement
10th March 2014
Test modules meet wide-range modulation challenges

Advantest has introduced two new test modules for high-speed, cost-efficient testing of radio-frequency (RF) ICs used in cell phones and wireless LAN devices built to meet 802.11ac and LTE-Advanced mobile communication standards. Both the 32-port WLS32-A module and the 16-port WLS16-A module are fully compatible with Advantest’s T2000 platform.

Test & Measurement
5th March 2014
Digital channel card offers data rates up to 16Gbps

Advantest’s latest digital channel card is the Pin Scale Serial Link (PSSL) for at-speed characterisation and volume production of high-speed semiconductors. PSSL is capable of data rates up to 16 Gbps. It extends the speed and performance capabilities of Advantest’s previous Pin Scale cards to enable affordable, at-speed testing of high-end ICs.

Test & Measurement
6th February 2014
Next generation of memory ICs get test upgrade

Advantest now has a test solution for next-generation memory ICs that enable high-demand mobile applications and servers. With its highly parallel testing capabilities and full compatibility as an upgrade on Advantest’s widely used T5503 test platform, the new T5503HS offers high productivity and low cost of test within an upgradable design.

Test & Measurement
16th December 2013
Module lowers cost of advanced CMOS image testing

Advantest’s T2000 ISS IPE2 image-processing test module has been developed to apply greater image-processing capabilities to test today’s CMOS image sensors at higher throughput and lower cost. Advanced CMOS image sensors (CIS) are used extensively in today’s smart phones, tablet computers, digital cameras, video camcorders and other high-volume electronic products.

Actualités sur l'industrie
27th November 2013
Advantest présente son handler de test haute performance pour les dispositifs SoC, offrant la meilleure productivité et souplesse du marché

Advantest Corporation présente son nouveau handler pour les dispositifs SoC (System On Chip), le système pick-and-place  évolutif M4871. L'appareillage intègre la technologie éprouvée d'Advantest appliquée sur les autres lignes de produits existant dans l'entreprise, avec de nouvelles fonctions avancées, incluant l'alignement visuel à haut débit, le contrôle thermiqu...

Test & Measurement
27th November 2013
High-performance test handler for SoC devices

Advantest have unveiled the field-upgradable M4871 pick-and-place system. The company's latest test handler for system-on-chip devices, it integrates Advantest’s proven technology from existing product lines with advanced, new functionality including visual alignment with high throughput, and active thermal control using Advantest’s Tri-Temp capability.

Test & Measurement
27th November 2013
Automated Test Equipment in the Cloud

A revolutionary pay-per-use solution combines semiconductor test with cloud computing technology, offering semiconductor companies access to test capabilities while minimising investment and effort. Stephane Cavazzini, Advantest’s Sales Account Manager for SOC IDM, explores further in this ES Design magazine article.

Communications
4th November 2013
Advantest enregistre trois commandes pour son système F7000 de lithographie par faisceau d'électrons

Advantest Corporation annonce aujourd'hui qu'elle a enregistré ses trois premières commandes pour son nouveau système de lithographie par faisceau d'électrons, le F7000, auprès de l'Université de Tokyo, de l'Université de Kyoto, et d'un client de l'industrie des semi-conducteurs. Les systèmes seront livrés dans l'année fiscale se terminant en mars 2014. 

Actualités sur l'industrie
10th October 2013
Advantest Europe Lance La Nouvelle Solution Cloudtesting À SEMICON Europa 2013

Advantest Europe GmbH annonce aujourd'hui qu'il sera le partenaire européen du Service CloudTesting. Au travers de ce partenariat, Advantest offre un accès à des capacités de test aux entreprises de semi-conducteurs tout en minimisant leur investissement et leur engagement. Ce service est idéal pour les ingénieurs de vérification de conception, les fabless et les institutions éducatives disp...

Essai et Mesure
17th September 2013
Le Système V93000 Dragon d'Advantest Sélectionné Comme Principale Plateforme De Test Par SHHIC, Fournisseur Majeur De Circuits Intégrés RFID De Chine

Advantest Corporation a annoncé que Shanghai Huahong Integrated Circuit Co., Ltd est le premier fabricant de puces électroniques à utiliser le testeur générique V93000 Smart Scale d'Advantest dans sa configuration low-cost Dragon pour le test hautement parallèle des semi-conducteurs RFID. L'architecture Universal Pin du testeur, disponible sur tous les systèmes Smart Scale, élimine le besoin...

Test & Measurement
8th July 2013
Multi-Site Testing Solution Targets Mobile Power-Management ICs

Advantest has entered the market for testing system-on-chip (SoC) mobile power-management ICs (PMIC) using the V93000 platform. Compatible with Advantest’s base of V93000 systems, the new solution can perform multi-site testing of complex SoC devices and single in-line packages (SiP) with embedded power-management cores.

Design
27th June 2013
Advantest and Galaxy Partner to Improve OEE with New Test Floor Intelligence Software Solutions

Advantest Corporation and Galaxy Semiconductor Solutions have entered a joint development and distribution agreement for Advantest’s new Test Floor Intelligence software solutions. Advantest and Galaxy will cooperate to deliver advanced test-floor management systems that monitor and optimize test processes for both systems- and device-related issues, helping customers improve their overall equipment effectiveness. Advantest’s TFI software sol...

Design
27th June 2013
Advantest Introduces New Test Floor Intelligence Software Solution

Advantest Corporation has introduced its newest Test Floor Intelligence software solution, TFI 2.0, designed to improve the overall equipment effectiveness of production test operations by efficiently mining and analyzing the large volume of data generated during semiconductor testing.

Analysis
13th May 2013
Advantest’s VOICE 2013 Conference Attracts Over 300 Attendees

The 2013 edition of the VOICE annual Users Group Conference organized by Advantest and a committee of partner companies, attracted over 300 test engineers and managers from 43 companies to San Jose, California, on April 23-24. This year’s event set a new record for registered attendees with many of them travelling from various locations in the United States, Canada, Europe, Israel, Asia and Japan.

Analysis
25th April 2013
Advantest Acquires System Level Test Automation Software Provider W2BI

Advantest Corporation and W2BI have reached an agreement in principle that Advantest will acquire W2BI, a provider of system level test automation software focusing on wireless communications. Based in New Jersey, W2BI will become a fully-owned subsidiary of Advantest’s US subsidiary, Advantest America. The acquisition is scheduled for finalization in May 2013, pending the completion of all required procedures.

Analysis
15th April 2013
Advantest Earns Supplier Excellence Award From Texas Instruments

Advantest has earned the Texas Instruments 2012 Supplier Excellence Award. Advantest provides the M4841 pick-and-place test handler, which TI uses with its installed automated test equipment. This is the first time that Advantest has received this supplier award from TI. Advantest has installed M4841 Dynamic Test Handlers at TI’s manufacturing facilities around the world. The versatile handler’s universal compatibility enables it to enhance t...

Analysis
3rd April 2013
Advantest Enters MEMS Testing Market with Multiple System Installations at Freescale Semiconductor’s Facilities in Arizona and Asia

Advantest has entered the high-growth market for testing micro-electromechanical system (MEMS)-based sensors by installing V93000 Smart Scale systems at several of Freescale Semiconductor’s facilities around the world.

Analysis
14th February 2013
Advantest VOICE 2013 Conference to Feature High Quality Presentations for SOC Platforms and Handlers

VOICE 2013, a user group meeting and partners conference organized by Advantest Corporation will include a robust technical program with papers from users of the T2000, V93000 and handlers. The event, to be held April 23-25 in San Jose, California, is an international forum for sharing technical content and exchanging perspectives on the latest semiconductor testing techniques and best practices.

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