Advantest has introduced two new test modules for high-speed, cost-efficient testing of radio-frequency (RF) ICs used in cell phones and wireless LAN devices built to meet 802.11ac and LTE-Advanced mobile communication standards. Both the 32-port WLS32-A module and the 16-port WLS16-A module are fully compatible with Advantest’s T2000 platform.

Advantest’s latest digital channel card is the Pin Scale Serial Link (PSSL) for at-speed characterisation and volume production of high-speed semiconductors. PSSL is capable of data rates up to 16 Gbps. It extends the speed and performance capabilities of Advantest’s previous Pin Scale cards to enable affordable, at-speed testing of high-end ICs.

Advantest now has a test solution for next-generation memory ICs that enable high-demand mobile applications and servers. With its highly parallel testing capabilities and full compatibility as an upgrade on Advantest’s widely used T5503 test platform, the new T5503HS offers high productivity and low cost of test within an upgradable design.

Advantest’s T2000 ISS IPE2 image-processing test module has been developed to apply greater image-processing capabilities to test today’s CMOS image sensors at higher throughput and lower cost. Advanced CMOS image sensors (CIS) are used extensively in today’s smart phones, tablet computers, digital cameras, video camcorders and other high-volume electronic products.

Advantest Corporation présente son nouveau handler pour les dispositifs SoC (System On Chip), le système pick-and-place  évolutif M4871. L'appareillage intègre la technologie éprouvée d'Advantest appliquée sur les autres lignes de produits existant dans l'entreprise, avec de nouvelles fonctions avancées, incluant l'alignement visuel à haut débit, le contrôle thermiqu...

Advantest have unveiled the field-upgradable M4871 pick-and-place system. The company's latest test handler for system-on-chip devices, it integrates Advantest’s proven technology from existing product lines with advanced, new functionality including visual alignment with high throughput, and active thermal control using Advantest’s Tri-Temp capability.

A revolutionary pay-per-use solution combines semiconductor test with cloud computing technology, offering semiconductor companies access to test capabilities while minimising investment and effort. Stephane Cavazzini, Advantest’s Sales Account Manager for SOC IDM, explores further in this ES Design magazine article.

Advantest Corporation annonce aujourd'hui qu'elle a enregistré ses trois premières commandes pour son nouveau système de lithographie par faisceau d'électrons, le F7000, auprès de l'Université de Tokyo, de l'Université de Kyoto, et d'un client de l'industrie des semi-conducteurs. Les systèmes seront livrés dans l'année fiscale se terminant en mars 2014. 

Advantest Europe GmbH annonce aujourd'hui qu'il sera le partenaire européen du Service CloudTesting. Au travers de ce partenariat, Advantest offre un accès à des capacités de test aux entreprises de semi-conducteurs tout en minimisant leur investissement et leur engagement. Ce service est idéal pour les ingénieurs de vérification de conception, les fabless et les institutions éducatives disp...

Advantest Corporation a annoncé que Shanghai Huahong Integrated Circuit Co., Ltd est le premier fabricant de puces électroniques à utiliser le testeur générique V93000 Smart Scale d'Advantest dans sa configuration low-cost Dragon pour le test hautement parallèle des semi-conducteurs RFID. L'architecture Universal Pin du testeur, disponible sur tous les systèmes Smart Scale, élimine le besoin...

Advantest has entered the market for testing system-on-chip (SoC) mobile power-management ICs (PMIC) using the V93000 platform. Compatible with Advantest’s base of V93000 systems, the new solution can perform multi-site testing of complex SoC devices and single in-line packages (SiP) with embedded power-management cores.

Advantest Corporation and Galaxy Semiconductor Solutions have entered a joint development and distribution agreement for Advantest’s new Test Floor Intelligence software solutions. Advantest and Galaxy will cooperate to deliver advanced test-floor management systems that monitor and optimize test processes for both systems- and device-related issues, helping customers improve their overall equipment effectiveness. Advantest’s TFI software sol...

Advantest Corporation has introduced its newest Test Floor Intelligence software solution, TFI 2.0, designed to improve the overall equipment effectiveness of production test operations by efficiently mining and analyzing the large volume of data generated during semiconductor testing.

The 2013 edition of the VOICE annual Users Group Conference organized by Advantest and a committee of partner companies, attracted over 300 test engineers and managers from 43 companies to San Jose, California, on April 23-24. This year’s event set a new record for registered attendees with many of them travelling from various locations in the United States, Canada, Europe, Israel, Asia and Japan.

Advantest Corporation and W2BI have reached an agreement in principle that Advantest will acquire W2BI, a provider of system level test automation software focusing on wireless communications. Based in New Jersey, W2BI will become a fully-owned subsidiary of Advantest’s US subsidiary, Advantest America. The acquisition is scheduled for finalization in May 2013, pending the completion of all required procedures.

Advantest has earned the Texas Instruments 2012 Supplier Excellence Award. Advantest provides the M4841 pick-and-place test handler, which TI uses with its installed automated test equipment. This is the first time that Advantest has received this supplier award from TI. Advantest has installed M4841 Dynamic Test Handlers at TI’s manufacturing facilities around the world. The versatile handler’s universal compatibility enables it to enhance t...

Advantest has entered the high-growth market for testing micro-electromechanical system (MEMS)-based sensors by installing V93000 Smart Scale systems at several of Freescale Semiconductor’s facilities around the world.

VOICE 2013, a user group meeting and partners conference organized by Advantest Corporation will include a robust technical program with papers from users of the T2000, V93000 and handlers. The event, to be held April 23-25 in San Jose, California, is an international forum for sharing technical content and exchanging perspectives on the latest semiconductor testing techniques and best practices.

Advantest Corporation today announced that the company has installed the first evaluation unit of its new test cell at Marvell, integrating the company’s T2000 Enhanced Performance Package (EPP) and its M4841 Dynamic Test Handler.

VOICE 2013 is an international conference focusing on innovative test solutions for system-on-chip and memory semiconductor devices and handler solutions. The 2013 conference will include technical presentations, new product kiosks, interactive discussion sessions for users of the T2000, V93000 and memory test platforms and test cell solutions, offering extensive networking and learning opportunities for all attendees. A new addition to the progr...