Test modules meet wide-range modulation challenges

Advantest has introduced two new test modules for high-speed, cost-efficient testing of radio-frequency (RF) ICs used in cell phones and wireless LAN devices built to meet 802.11ac and LTE-Advanced mobile communication standards. Both the 32-port WLS32-A module and the 16-port WLS16-A module are fully compatible with Advantest’s T2000 platform.

The new modules use vector signal generation (VSG) and vector signal analysis (VSA) software to meet the wide-range modulation challenges presented by today’s most advanced portable electronics.

Each module offers a wide modulation bandwidth of 80 MHz combined with waveform generator software and modulation analysis software for 802.11ac and LTE-Advanced protocols.

The T2000 platform has a scalable architecture that allows users to change modules and configure the system to test virtually any semiconductor devices. This enables the tester to match both current and future testing requirements, whereas most other testers must be locked into a dedicated equipment configuration.

Keep Up to Date with the Most Important News

By pressing the Subscribe button, you confirm that you have read and are agreeing to our Privacy Policy and Terms of Use
Previous Post

CMOS DDR2 SDRAMs available in 512Mb & 1Gb densities

Next Post

Software, debugger collaboration enhances hardware testing