Semiconductor test solutions on parade at China show
Advantest will showcase its broad product portfolio, including its semiconductor test solutions, nanotechnology products and terahertz systems at SEMICON China (March 17-19) The show will be held at the Shanghai New International Expo Centre.
The company will highlight its V93000 and T2000 SoC test platforms, as well as its latest test solutions, including the EVA100 system for digital and analogue test in design evaluation, characterisation and production; the T6391 system for testing display driver semiconductors; and the TS9000 system for non-destructive mould thickness analysis of semiconductor packaging.
Other products to be featured in Advantest’s exhibit include its MPT 3000 memory system for testing advanced solid-state drives (SSDs) and its M6245 handler for testing advanced memories with fine pitches. In addition, multi-vision metrology solutions, including e-beam lithography and CD-SEM metrology will be highlighted.
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