Platform tests analogue, mixed-signal, sensor ICs
An evolutionary value-added platform that combines digital and analogue testing capabilities to handle small-pin-count analogue, mixed-signal and sensor semiconductors has been unveiled by Advantest. The EVA100’s expandable architecture provides the flexibility to conduct a wide range of measurement functions.
Operation is highly intuitive, alleviating the need for users to have advanced programming skills and helping customers to get their latest ICs to market faster.
Designed for use in both engineering and volume-production environments, the test platform allows simultaneous control of multiple test functions to achieve highly precise measurements and improve testing efficiency.
By integrating analogue-voltage and current-source measurements, an eight-channel, 100-Mbps pattern generator and an oscilloscope in one compact, lightweight system, it also eliminates the need for complicated cabling to connect and coordinate the various instruments.
“Analogue and mixed-signal ICs are critically important in enabling the increasing performance, higher accuracy and longer reliability of today’s smart electronics,” said Satoru Nagumo, executive officer of Advantest. “Our new monolithic test solution eliminates the high cost, complex set up and long lead times required when using several kinds of measurement instruments to test these devices.”
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