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Advantest Europe GmbH

Advantest Europe GmbH Articles

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Test & Measurement
1st June 2016
Die-level handler tests ICs for high-growth applications

The HA1000 die-level handler is a cost-efficient test solution for determining known good dies (KGD) prior to IC packaging announced by Advantest. Economics is a driving factor in die-level testing. Determining a semiconductor device’s viability prior to packaging or building memory stacks is critical to avoiding rework, achieving high yields and lowering costs.

Events News
2nd May 2016
San Diego & Taiwan host semiconductor test conference

Dual sessions in the United States and Asia will be key features of Advantest’s 10th annual VOICE Developer Conference. Key players in the semiconductor test industry will get opportunities to hear more than 120 technical presentations, talk with experts at technology kiosks, visit the Partners’ Expo, attend networking events and conduct in-depth discussions relating to Advantest’s broad range of IC test solutions.

Events News
20th April 2016
Test developer conference celebrates 10th anniversary

VOICE, the annual developer conference hosted by leading semiconductor test equipment supplier Advantest will celebrate its 10th anniversary in May with a comprehensive line-up of more than 120 technical presentations, technology kiosks, a Partners’ Expo, multiple networking events and opportunities for in-depth discussions about Advantest’s test platforms as well as handlers, test cell solutions and related technologies.

Test & Measurement
29th March 2016
Versatile tester targets wide range of flash memories

The new T5830 memory tester is the latest member of Advantest’s T5800 product family, optimised for testing a wide range of flash memory devices used in mobile electronic devices.  As portable applications are booming, the global market for flash-memory test systems is projected to reach $148 million by 2018, according to market analysis firm VLSIresearch.

Events News
9th March 2016
Test solutions take the road to Shanghai

Test solutions for measuring the connected world – and everything in it – will be demonstrated by Advantest at the SEMICON China trade show in Shanghai (March 15-17). In addition to exhibiting, Advantest is sponsoring two events at the show - the Build China IC Manufacturing Ecosystem Forum and the China Semiconductor Technology International Conference (CSTIC).

Test & Measurement
8th March 2016
Analogue pin module tests SoCs for IoT & mobiles

The DC Scale AVI64 module from Advantech is designed to give the V93000 single scalable platform the broadest application coverage on the market. Using Advantest’s innovative universal analog pin architecture, the 64-channel module extends the V93000 platform’s capabilities to include testing of power and analog ICs that enable smart, internet-connected electronics for the rapidly growing mobile, automotive and Internet of Things (IoT...

Test & Measurement
15th December 2015
Tokyo date for pressure sensor test unit

The new HA7200 temperature and pressure stimulus unit, designed to apply the precise temperature and pressure required for final testing of pressure sensors has been unveiled by Advantest. Up to four sensors can be tested in a small chamber with the temperature controlled by the dual-fluid technology used on Advantest’s test handlers.

Events News
14th December 2015
Debut makers lined up for SEMICON Japan

Advantest will have a prominent presence at the SEMICON Japan trade show (December 16-18) at the Tokyo Big Sight international exhibition centre. In addition to showcasing a wide spectrum of automatic test equipment (ATE) and presenting a technical paper, Advantest is a gold sponsor of this year’s event, which includes sponsoring the President’s Reception on December 16.

Test & Measurement
7th December 2015
Tester takes on high performance flash devices

The T5851 system is designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) – memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops.

Test & Measurement
6th November 2015
Test system streamlines chip & sensor production

The latest model of its EVA100 measurement system, the high-throughput EVA100 Production Model designed for volume production of sensors, low-pin-count analogue ICs and mixed-signal ICs has been introduced by Advantest. Fully compatible with the initial EVA100 system introduced last year, the new Production Model allows users to establish a standardised measurement environment from design evaluation through production, dramatically improving thei...

Test & Measurement
24th October 2015
TDR option enhances semiconductor quality analysis

A new TDR Option for Advantest’s TS9000 series of terahertz analysis systems has been released. It enables analysis of circuit quality in semiconductors, printed substrates, electronic components, and other applications, utilising short-pulse terahertz waves.

Events News
9th October 2015
Semiconductor test conference issues Call for Papers

An international call for papers on semiconductor test solutions, best practices and innovative technologies has been issued for next year’s tenth annual VOICE Developer Conference, organised by Advantest. Based on the success of holding VOICE sessions in China and the U.S. last year, the 2016 conference will again be held on both sides of the Pacific Ocean – in San Diego, California on May 10-11 and in Hsinchu, Taiwan on May 18 &ndas...

Test & Measurement
5th October 2015
IoT test devices on parade at SEMICON Europa

A full line of test solutions for automotive, communications and consumer devices will be shown by Advantest together with its metrology and advanced E-beam lithography systems at SEMICON Europa Dresden (October 6-8). Visitors will be able to learn more about the V93000 platform’s capabilities in improving time to quality (TTQ) in multi-site radio-frequency (RF) applications and testing IoT devices.

Events News
17th September 2015
EB lithography on parade in The Hague

EB (electron beam) lithography and MVM-SEM (Multi-Vision Metrology Scanning Electron Microscope) solutions will be showcased by Advantest at the 41st Micro and Nano Engineering Show in The Hague (Sept 21-24). Highlighted products include theF7000 EB lithography system for direct writing of nano-patterns on wafers, the E3310 and E3640 MVM-SEM systems for wafer and mask metrology and the E5610 DR (defect review)-SEM for inspecting next-generation p...

Test & Measurement
17th August 2015
SoC test system offers high performance & scalability

DA-Integrated has installed a V93000 Smart Scale SoC test system from Advantest. DA-Integrated’s selection of the V93000 Smart Scale system is based on the tester’s high performance and scalability, its widespread use at outsourced semiconductor assembly and test foundries and its compatibility with the previous P1000 test system, legacy equipment from Advantest’s 2011 acquisition of ATE supplier Verigy.

Test & Measurement
17th August 2015
High speed memory test card supports up to 16Gb/s

Advantest has introduced the fastest fully integrated memory test card in history, the HSM16G. The card extends the high-speed testing capabilities of the company’s V93000 HSM series of testers to native 16Gb/s for at-speed testing of ultra-fast memory ICs. Advantest's ATE solution supports device engineering, debugging and volume production of today’s highest speed GDDR5 and future GDDR5X ICs, with parallel data busses up to 16Gb/s.

Analysis
12th August 2015
Solid state drive deal opens door to subcontract test

Advantest has entered a strategic partnership with Universal Scientific Industrial (Shanghai) (USI), a member of the ASE Group of companies, to offer the first dedicated outsourced assembly and test (OSAT) services to the growing market for solid-state drives (SSDs). This collaboration allows SSD manufacturers to test their designs and devices on the advanced MPT3000 test platform while minimising up-front capital investment by outsourcing test a...

Events News
11th August 2015
Test solutions centre stage at Intel Developers Forum

The Intel Developers Forum will see Advantest showcase its test solutions for emerging market segments including the Internet of Things (IoT) and wearable electronics. The new T5833 and proven T5831 memory testers, which are built on Advantest’s modular AS Platform will be centre stage at the Forum (August 18-20) in San Francisco.

Memory
3rd August 2015
Single-system testing for SAS, SATA & PCIe protocol SSDs

Advantest has announced firmware that enables all MPT3000 systems to test Serial Attached SCSI (SAS) 12G and Serial ATA (SATA) 6G SSDs, making this tester the first true single-system solution for testing SAS, SATA and PCIe protocol SSDs. The addition of SAS and SATA to the proven support for PCIe 3.0, NVMe and AHCI extends the platform’s test coverage to include SSDs that use any of today’s major protocol standards.

Test & Measurement
3rd August 2015
Firmware extends SSD testing to SCSI 12G and SATA 6G

Downloadable firmware that enables all MPT3000 systems to test Serial Attached SCSI (SAS) 12G and Serial ATA (SATA) 6G solid-state drives (SSDs) has been released by Advantest. The company says that it makes the tester the first true single-system solution for testing SAS, SATA and PCIe protocol SSDs.

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