To provide an efficient test solution for the SSD market, the MPT3000 combines high-speed system-on-chip (SoC) testing with a state-of-the-art electronics architecture, including proprietary hardware acceleration and performance up to 12G. In addition to incorporating a chamber capable of maintaining precise device thermal consistency, the system provides independent device power control for testing new high-power enterprise SSDs.
Multi-protocol capability and high parallelism enable full performance testing of a variety of SSD form factors including 2.5-inch drives, half- and full-height PC cards, M.2, and devices with customized form factors. This versatility enables SSD manufacturers to pursue multiple business opportunities simultaneously and adapt to the sudden changes characteristic of high-growth markets.
In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can more quickly transition from one product version – or one product generation – to the next, by eliminating retooling efforts.
The adoption of PCIe 3.0 and NVM Express, the next wave of mass market, high-performance protocols, is expected to lead to continued growth in SSDs. SSD manufacturers have reported that more flexibility to develop new products increases gross margins, and that earlier product introduction increases market share. Advantest designed its flexible MPT3000 system to meet customers’ testing needs for both enterprise and client SSDs.