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Advantest Europe GmbH

Advantest Europe GmbH Articles

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Test & Measurement
30th June 2017
Memory tester features powerful MRA capability

Optimised for wafer-level testing of DRAMs, NAND devices and other non-volatile memories used throughout portable electronic devices, Advantest has launched the T5822 memory tester, the newest member of its T5800 product series. With mobile applications booming, semiconductor manufacturers need low-cost solutions for high-volume testing of a wide range of price-sensitive memory ICs.

Test & Measurement
22nd June 2017
Mixed-signal channel card aids IoT device testing

A high-resolution, highly accurate mixed-signal channel card has been added to its Wave Scale MX product family by Advantest. It extends the series range in testing analogue-to-digital and digital-to-analogue waveform converters. The Wave Scale MX high-resolution card combines high parallel testing capability with reliable AC and DC performance.

Analysis
12th June 2017
Advantest earns five stars on annual VLSIresearch customer satisfaction survey

Advantest announces it has earned a place on VLSIresearch’s 10 BEST list for the 29th consecutive year, earning the sought-after Five-Star rating from its global customers. Rankings are based on direct customer feedback representing the full spectrum of IC device makers that include Integrated Device Manufacturers (IDMs), Fabless companies, and Outsourced Assembly and Test (OSAT) producers.

Analysis
10th May 2017
Duo partner to develop semiconductor test solutions

Advantest Europe and Nash Technologies have announced a strategic partnership to develop solutions for test of semiconductor devices. Advantest’s SoC market share is growing significantly and customers demand solutions to test their devices on its leading V93000 and T2000 test platforms.

Events News
24th April 2017
Semiconductor test conference enters second decade

VOICE, the annual developer conference hosted by semiconductor test equipment supplier Advantest will kick off its second decade with 113 technical presentations, an expanded Technology Kiosk Showcase, and a new technology track. Additionally, VOICE 2017 will include three diverse keynote speakers, a Partners’ Expo, and interactive discussion sessions for users of the V93000 and T2000 SoC test platformsas well as Advantest test cell solutio...

Events News
18th April 2017
Test solutions all set for Penang exhibition

Visitors to SEMICON Southeast Asia can learn about the latest in test equipment solutions by visiting semiconductor test equipment supplier Advantest Corporation's stand. The exhibition takes place at the SPICE Arena in Penang, Malaysia (April 25-27). Advantest is a silver sponsor of SEMICON Southeast Asia.

Analysis
7th April 2017
Great Place to Work names Advantest as one of Germany's best employers

Advantest Europe GmbH has been recognized as one of Germany’s Best Employers 2017 by the internationally-renowned consulting firm, Great Place to Work. The annual survey ranks companies of all sizes, sectors and regions based upon high-trust, high-performance workplace cultures and determines the 100 best employers in Germany.

Events News
23rd March 2017
Semiconductor test company has a DATE in Lausanne

Semiconductor test equipment supplier Advantest will showcase its CloudTesting Services (CTS) at DATE 2017, the European event for electronic systems design and test. The annual conference, which takes place at the SwissTech Convention Centre in Lausanne, Switzerland (March 28-30) combines a technical program with an international exhibition of electronic design automation and test technologies.

Events News
13th March 2017
VOICE keynotes promise riveting presentations

VOICE, the annual developer conference hosted by leading semiconductor test equipment supplier Advantest will offer three diverse keynote addresses ranging from future trends to cyber security to the global semiconductor industry.

Events News
9th March 2017
Test solutions on parade at SEMICON China 2017

A wide variety of test solutions will be displayed by Advantest at the SEMICON China 2017 trade show in Shanghai (March 14-16). Advantest will feature both its newest test solutions and its proven products for the China market under the theme, “Measure the Connected World and Everything in It”.

Events News
2nd February 2017
SEMICON Korea provides venue for new test solutions

A wide array of test solutions is being prepared by Advantest ahead of this year’s SEMICON Korea trade show in Seoul (February 8-10). Advantest will showcase both its newest test solutions and its proven products for the Korean market. Featured products and services will include industry-leading test and measurement platforms, performance-enhancing modules and channel cards, e-beam lithography and metrology-SEM systems, performance boards, ...

Displays
25th January 2017
Advantech and Matrox expand relationship for video wall solutions

  Advantech, an embedded computing solution provider across multiple market verticals, has announced the expansion of their technology relationship with Matrox Graphics, a leader in the field of video wall and multi-display solutions. 

Events News
10th January 2017
Semiconductor test conference opens up registration

Registration has opened for those wishing to attend Advantest’s VOICE 2017 Developer Conference being held in Palm Springs, California, on May 16-17 and Shanghai, China on May 26. Both conferences will feature the theme "Measure the Connected World and Everything in It” as VOICE kicks off its second decade.

Events News
12th December 2016
IoT test in focus at SEMICON Japan in Tokyo

A wide range of test solutions for diverse applications throughout the Internet of Things (IoT)will be featured by Advantest at this year’s SEMICON Japan (December 14-16) in Tokyo. Advantest will showcase both its newest test solutions and its market-proven products. Displays will be organised into four general categories of IoT applications: Industrial, Wireless/Wearables, Connected Homes, and Connected Automobiles.

Test & Measurement
5th December 2016
Pick and place IC handler enhances manufacturing efficiency

A pick-and-place handler has been developed by Advantest to improve productivity in testing system-on-chip (SoC) devices in high-volume manufacturing (HVM) and device characterisation pre-production environments. This helps users to keep pace with the rapidly changing SoC market and quickly adapt to changes in device technology.

Events News
3rd November 2016
electronica 2016: AD-converter tester on parade in Munich

Semiconductor test equipment supplier Advantest will highlight the latest measurement solutions for automotive, communications and consumer devices at electronica in Munich (November 8-11). Show attendees can learn more about Advantest’s EVA100 measurement system for low-pin-count analogue, mixed-signal IC and sensor devices.

Test & Measurement
2nd November 2016
Order book opens for SiP device test system

The T2000 AiR, a compact, air-cooled system optimised for low-cost testing in R&D and high-mix, low-volume production is available to order from Advantest. Shipments to customers are expected to begin in the first quarter of calendar year 2017. Global market demand continues to grow for smartphones and other mobile electronic devices as well as consumer and enterprise services offered over the internet.

Events News
20th October 2016
RF test solution headed to SEMICON Europa

A full line of test solutions for automotive, communications and consumer devices together with metrology and advanced E-beam lithography systems will be exhibited by Advantest at SEMICON Europa in Grenoble (October 25-27). Visitors will see the latest product developments for the V93000 platform.

Component Management
19th September 2016
E-beam lithography system to feature at Vienna show

The F7000 EB (electron beam) lithography system will be the centerepice of Advantest’s stand at the Micro and Nano Engineering Show in Vienna (September 19-23). The system delivers high throughput and creates very accurate and smooth nano-patterns on wafers from 1X-nm resolutions.

Test & Measurement
8th August 2016
Solid state drive testing shifts to single platform

 The MPT3000HVM system has been developed by Advantest to provide a single platform to test the full range of SATA, SAS, and PCIe solid-state drives (SSDs), from the highest performance enterprise to the most cost-effective client SSDs. The system achieves this optimal production test solution by leveraging the proven MPT3000 tester-per-DUT (device under test) architecture and unique hardware acceleration in a new high-density configuration.

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