The T5822 is designed to provide manufacturers of multiple memory devices with cost efficiency and optimal functionality, including full test coverage of as many as 1,536 devices in parallel with data transfer rates up to 1.2 gigabits per second (Gbps).
The new tester offers high-voltage resources such a level driver and DC testing capability along with an economical compact test head. It also features a powerful memory repair analysis (MRA) capability to help customers maximise their yields.
Using Advantest’s FutureSuite operating system, the system is compatible with test programmes for a range of memory devices. With output voltages from -10 to 13V, it provides the flexibility and economic performance to handle low-pin-count to high-pin-count devices.
In addition, the T5822 has the same modular architecture as its predecessors, providing users with a seamless transition from any other T5800 series tester.
“The T5822 is an optimal mixed-memory test solution, enhancing customers’ ROI while also reducing risk,” said Masuhiro Yamada, Executive Officer at Advantest.