Technical insight will be provided through demonstrations as well as digital graphics and in-depth presentations, allowing visitors to learn all about the latest IC test innovations offered by Advantest.
On Thursday, February 9, at 2:00 p.m., Jeongseob Kim, director of Advantest Korea’s SoC department, will present a paper on “The Challenges of Testing IoT Modules on ATE Systems” during the half-day Test Forum.