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20th February 2018
5G mmWave test system makes debut at MWC 2018

A 5G test solution that enables both the network and the device ecosystems to emulate end-to-end use cases to meet interoperability requirements and gain insights into overall system behaviour will be showcased by W2BI, an Advantest Group company at Mobile World Congress in Barcelona (February 26 - March 1).

Events News
24th January 2018
Advanced IC test solutions set for SEMICON Korea

Leading semiconductor test equipment supplier Advantest will present its innovative test solutions at SEMICON Korea in Seoul (January 31-February 2). Additionally, Advantest is a platinum sponsor of SEMICON Korea and the Industry Leadership Dinner, which will take place the evening of January 31.

Events News
29th December 2017
Early bird discount offered at VOICE 2018 registration

Semiconductor test equipment supplier Advantest has opened registration for its VOICE 2018 Developer Conference. VOICE will return to San Diego, California (May 15-16) and Hsinchu, Taiwan (May 23) under the unifying theme "Measure the Connected World and Everything in It”.

Test & Measurement
8th December 2017
Stimulus test cell accelerates sensor testing

The HA7300 stimulus test cell announced by Advantest is a full capability solution for the testing of differential pressure sensors which are becoming pervasive in modern automobile designs focused on better fuel economy and green technologies. The HA7300 delivers high-speed, highly precise test temperature control with a proprietary technology that utilises a heat or cold plate to control the temperature of the sensors under test.

Test & Measurement
4th December 2017
Enhanced modules aid EV powertrain tests

Semiconductor test equipment supplier Advantest has introduced two modules that enable its T2000 IPS system to test high-voltage and high-power devices used in the power trains of electric vehicles (EV/HV). The enhanced MMXHE (multifunction mixed high voltage) and MFHPE (multifunction floating high power) modules enable massively parallel, high-performance testing by leveraging Advantest’s multifunctional pin design, which allows flexibilit...

Test & Measurement
28th November 2017
Automated handler cuts cost of mobile IC test

The M4171 handler from semiconductor test equipment supplier Advantest has been developed to meet the mobile electronics market’s needs for cost-efficient thermal control testing of ICs with high power dissipation during device characterisation and pre-production bring up.

Events News
9th November 2017
Automotive test solutions motor into Munich

A line of test solutions for automotive, communications and consumer devices together with metrology and advanced E-beam lithography systems will be showcased by Advantest at SEMICON EUROPA in Munich (14-17 November). Show attendees can learn about Advantest’s latest product developments in semiconductor test.

Events News
9th November 2017
IC test solutions on parade at productronica

Semiconductor test equipment supplier Advantest will highlight the latest measurement solutions for automotive, communications and consumer devices at productronica in Munich (14-17 November). The company will demonstrate its EVA100 analogue/mixed-signal test solution that combines a modular architecture with high-voltage and high-precision analogue parametric measurement units, providing the flexibility to conduct various measurements over a bro...

Events News
28th September 2017
Cloud testing showcased at RADECS 2017

Semiconductor test equipment supplier Advantest will showcase its CloudTesting Services (CTS) at RADECS 2017, the annual European forum for the presentation and discussion of the latest advances in the field of radiation effects on electronic and photonic materials, devices, circuits, sensors, and systems.

Events News
18th September 2017
VOICE 2018 calls for papers

An international call for papers has been announced by Advantest for the VOICE 2018 Developer Conference focusing on innovative test solutions for system-on-chip (SoC) and memory semiconductor devices, handler solutions, best practices and hot topics. The 2018 conference will return to the 2016 host cities of San Diego, CA and Hsinchu, Taiwan on May 15-16 and on May 23, respectively, under the unifying theme “Measure the Connected World&hel...

Test & Measurement
17th September 2017
EB lithography system takes centre stage at MNE

Semiconductor test equipment supplier Advantest will feature its F7000 EB (electron beam) lithography system and other nanotechnology-ready equipment at the 43rd Micro and Nanoengineering (MNE) show (September 18-22) in Braga, Portugal. The MNE program and exhibition covers current and relevant activities in micro- and nanoengineering.

Test & Measurement
12th September 2017
Test automation platform addresses LTE, GSM and WCDMA

The MLT1600 cloud-enabled, device test automation tester has been unveiled as the newest member of its Micro Line Tester portfolio by W2BI, an Advantest Group company. It is designed to meet the testing challenges of IoT products across multiple cellular radio technologies – such as GSM, WCDMA and LTE – with a 70MHz to 6GHz frequency range.

31st August 2017
Advantest selected as Index Component for SNAM Sustainability Index

Semiconductor test equipment supplier Advantest has been selected as an index component of the SNAM Sustainability Index managed by Sompo Japan Nipponkoa Asset Management (SNAM). The SNAM Sustainability Index combines evaluations of ESG (environment, society, and governance) and share prices.

Events News
22nd August 2017
Annual developer conference enters second decade

Semiconductor test equipment supplier, Advantest, held its VOICE 2017 Developer Conference in May. The 2017 event marked the conference entering its second decade with 113 technical breakout sessions, two Partners’ Expos, 29 technology kiosks and multiple networking opportunities for members of the semiconductor test industry. This year’s 11th edition featured dual sessions on 16th to 17th May in Palm Springs, California, an...

Events News
8th August 2017
SSD test solutions on parade at Flash Memory Summit

Semiconductor test equipment supplier Advantest will showcase the latest additions to its MPT3000 series of solid-state drive (SSD) test solutions and present two technical papers at this year’s Flash Memory Summit (8-10 August ) at the Santa Clara Convention Centre. Advantest is an emerald sponsor of the 2017 Summit.

Test & Measurement
1st August 2017
Upgrades enhance solid state drive test coverage

Solid State Drive (SSD) test coverage has been extended by Advantest with enhancements to the company’s MPT3000 series. With hundreds of systems already installed, the product line is now extended to cover more test insertions including engineering, low-volume production, and built-in self-test (BIST) applications, all with the same MPT3000 architecture and software.

Test & Measurement
24th July 2017
Fixture extends test capabilities for display driver ICs

Semiconductor test equipment supplier Advantest has introduced the RND440 Type 3 fixture, an optional enhancement on its T6391 display driver IC (DDI) tester that makes the system capable of massively parallel testing of chip-on-film (CoF) packages for the latest generation of smart phone screens.

Events News
6th July 2017
Test solutions and technical papers on display at SEMICON West

Semiconductor test equipment supplier, Advantest, will showcase its innovative test solutions, present three technical papers and sponsor several activities at the SEMICON West 2017 trade show, taking place 11th to 13th July to Moscone Center in San Francisco. “As a global leader in semiconductor test solutions, we are uniquely positioned to deliver end-to-end solutions for the connected world,” said Judy Davies, Vice President of Glo...

Test & Measurement
30th June 2017
Memory tester features powerful MRA capability

Optimised for wafer-level testing of DRAMs, NAND devices and other non-volatile memories used throughout portable electronic devices, Advantest has launched the T5822 memory tester, the newest member of its T5800 product series. With mobile applications booming, semiconductor manufacturers need low-cost solutions for high-volume testing of a wide range of price-sensitive memory ICs.

Test & Measurement
22nd June 2017
Mixed-signal channel card aids IoT device testing

A high-resolution, highly accurate mixed-signal channel card has been added to its Wave Scale MX product family by Advantest. It extends the series range in testing analogue-to-digital and digital-to-analogue waveform converters. The Wave Scale MX high-resolution card combines high parallel testing capability with reliable AC and DC performance.

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