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Test equipment delivers multiple solutions at SEMICON Korea

28th January 2020
Mick Elliott

Semiconductor test equipment supplier Advantest will feature its newest test solutions for advanced ICs at SEMICON Korea in Seoul, South Korea (February 5-7). In addition to high-speed memory test solutions, Advantest will exhibit a wide range of products and solutions that contribute to the 5G revolution and accelerate the development of other applications such as ADAS/autonomous driving, IoT/smart devices and AI.

“This year’s product showcase will highlight our continuous efforts to contribute to the evolving semiconductor industry by enabling leading-edge test technologies,” said Judy Davies, Advantest’s vice president of global marketing communications. “By reinforcing our core businesses and pioneering new activities, we are continuing to address the emerging needs and challenges of the ever-changing semiconductor supply chain.”

New product highlights will include the V93000 Wave Scale Millimeter solution, an integrated and modular multi-site millimeter-wave (mmWave) ATE test solution to cost-effectively test 5G-NR mmWave devices up to 70 GHz.

Two new modules integrated with the new round-type HIFIX for the T2000 series test platform will be demonstrated. These are designed to enhance test coverage, enable higher parallelism and reduce the cost of test for system-on-chip (SoC) devices used in automobiles.

The MPT3000ARC test platform combines thermal-control capability with high throughput, enabling extreme thermal testing of solid-state drives (SSDs) including PCIe Gen 4.

Other products and solutions to be featured include the V93000 SMU8 System for next-generation DC parametric testing required on the 28-nm to 3-nm process nodes and beyond; T5800-series memory testers providing end-to-end test solutions from wafer-level to final test; the T5503HS2 system, the only tester of its kind to evaluate the advanced features of next-generation, high-speed LPDDR5 and DDR5 memory ICs; and HiFIX high-speed memory test solutions supporting advanced device testing at speeds over 16 Gbps.

In addition, Sungjong Park, RF test engineer/manager with Advantest Korea, will talk about “5G NR Semiconductor Test Challenges” at the Test Forum on February 5.

Masashi Nagai, senior executive director of Advantest Korea’s Strategic Planning Group, will give a presentation titled “Driving for Perfection: Finding the Optimum Test Solution for Next-Generation Automotive ICs” at the SMART Mobility Forum.

Also on February 6, Kyoungyong Kang, SoC UI Team Lead, Advantest Korea, will present “Test Cell Management for Enabling SMART Manufacturing” at the SMART Manufacturing Forum.

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