Test & Measurement
New Webinars for Waveform Generation, USB3.0 Testing and S-Parameter Measurements
LeCroy is offering a series of free webinars in the coming weeks
A NeWith the expansion of sensors and embedded system to more and more areas of everyday life, the need for generation of complex analog and digital signals has increased accordingly. Generating several channels of arbitrary waveforms in parallel or the combination of analog and digital signals is demanding.
The webinar will demonstrate how the LeCroy ArbStudio Arbitrary Waveform Generator simplifies the creation and generation of complex arbitrary signals. Find out how numerous features of the ArbStudio software make signal generation surprisingly easy.
Date: 9 March 2011
Time: 14:30 CET / 13:30 GMT
Fast S-parameter Measurement for Signal Integrity Engineers
The use of s-parameters to characterize connectors, cables, backplanes and devices has increased in recent years as the transfer speeds of serial data interfaces have increased. Traditionally, instruments such as vector network analyzers (VNA) have been used for such measurements but these instruments are expensive and extremely complex to use.
This webinar introduces a new time domain method which combines the speed and low cost of TDR/TDT measurements with the range and accuracy of a VNA. The background theory of the instrument’s operation will be presented as well as example measurements on typical hardware with comparisons to measurements made using a VNA.
Date: 10 March 2011
Time: 14:30 CET / 13:30 GMT
USB 3.0 Performance Validation Webinar- in co-operation with Evatronix
The main driver for development of the SuperSpeed USB interface was the significant increase of the theoretical data transfer speed – from 480 Mb/s to 5 Gb/s. Join LeCroy and Evatronix for a real-life engineering guide of the USB 3.0 standard and its limitations. Find out what you can actually expect from this interface and how to apply a successful performance validation methodology for your USB 3.0 design.
The webinar will be focused on hardware and software overhead of the USB 3.0 interface and methods for proper data transfer speed validation. The practical example of a USB Mass Storage UAS application will be used to explain the impact of each of the USB layers on the interface performance, while the applied validation methodology will provide proper system evaluation.
Date: 3 March 2011
Time: 14:30 CET / 13:30 GMT
Date: 16 March 2011
Time: 14:30 CET / 13:30 GMT
Product Spotlight
APV1111GVY
Panasonic
Panasonic PhotoMOS® Photovoltaic MOSFET High-Power Drivers
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| Cost: | $3.95 |
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