Deep toolbox adds more options to oscilloscopes

2nd April 2019
Posted By : Mick Elliott
Deep toolbox adds more options to oscilloscopes

The WaveRunner 9000 Series mixed-signal oscilloscopes from Teledyne LeCroy come with a large, 15.4in. display, bandwidths from 500MHz to 4GHz, and sample rates up to 40GS/s. The oscilloscopes offer a complete collection of serial data debug and validation solutions, making it ideal for embedded system, automotive, and EMC/EMI test applications.

The ubiquity of embedded computing systems with high-speed microprocessors drives industry demand for mid-range, mixed-signal oscilloscopes with high bandwidth and powerful debug and validation toolsets.

However, equipment budgets have not kept pace with the increase in microprocessor speed and complexity. This has forced engineers and managers to sacrifice certain capabilities in their test equipment. Teledyne LeCroy’s WaveRunner 9000 oscilloscopes offers all of the critical features—a large display, powerful toolbox, wide range of bandwidths, and enhanced resolution up to 11 bits—at an affordable price.

A wide selection of serial data triggering and decode (TD) packages provides powerful, flexible serial triggering with an intuitive colour-coded decode overlay.

Additionally, unique measure/graph and eye-diagram test (TDME) packages complement the TD packages by enabling extraction of decoded data and subsequent waveform data plots, performing bus timing measurements, and creating eye diagrams for testing against standard or custom masks.

This set of tools provides exhaustive causal analysis for not only embedded systems but also automotive applications, covering all aspects of Automotive Ethernet validation and debug, including 1000Base-T1 and 100Base-T1 compliance test.

WaveRunner 9000 oscilloscopes have standard capability to provide improved resolution with bandwidth tradeoffs by means of filtering, and each channel can be filtered independently. The filtered result shows the improvement in the number of effective bits at a given bandwidth.

For EMC/EMI compatibility applications, the instruments accurately characterise EMC test signals with a 40GS/s sampling rate and 1% gain accuracy. The spectral analysis mode pins down high harmonic peaks across a wide EMC band using an interactive peaks and markers table.

In addition, a dedicated EMC pulse parameter measurement package enables the user to tailor measurements to specific EMC/ESD standards.

Downloads


You must be logged in to comment

Write a comment

No comments




Sign up to view our publications

Sign up

Sign up to view our downloads

Sign up

Connected World Summit 2019
22nd October 2019
United Kingdom The Business Design Centre, London
Hotspots Specials 2019
24th October 2019
Germany Böblingen, Germany
IoT Solutions World Congress 2019
29th October 2019
Spain Barcelona
Maintec 2019
30th October 2019
United Kingdom NEC, Birmingham
NOAH Conference 2019
30th October 2019
United Kingdom Old Billingsgate, London