Test & Measurement

Keithley Publishes 2010 Test & Measurement Product Catalog CD

2nd March 2010
ES Admin
0
Keithley Instruments, has published its 2010 Test & Measurement Product Catalog in CD form. The CD offers details and technical specifications on Keithley’s general-purpose and sensitive sourcing and measurement products, DC switching, RF/microwave switching, data acquisition solutions, and semiconductor test systems.
Useful selector guides and tutorials simplify choosing the right solutions for specific applications. To request a free copy of the CD, visit: http://www.keithley.info/catalogcd10.



The CD is arranged by product type and application area with sections containing Keithley’s newest offering in test and measurement:



· Digital multimeters and systems

· Switching and control

· RF/microwave switching

· Power supplies optimized for telecom device test

· Source and measure products

· Low level measurements and sourcing

· Function/pulse/arbitrary/pattern generators

· Semiconductor test

· Optoelectronics test

· Data acquisition products

· Accessories



Keithley’s 2010 Test & Measurement Product Catalog CD includes several new and enhanced products:

· Basic, low current, and high voltage versions of the S530 Parametric Test System.

· A variety of software and hardware enhancements to the company’s popular Model 4200-SCS Semiconductor Characterization System, including new support for solar cell testing and C-V measurements.

· An enhanced version of Keithley’s ACS Basic Edition software, which supports combining high speed hardware control, device connectivity, and data management into an easy-to-use tool for part verification, debugging, and analysis.

· A growing range of applications for Keithley’s Series 2600A System SourceMeter® Instruments.

· The Model 3731 6x16 reed relay matrix card, the latest addition to the Series 3700 System Switch/Multimeter family.



Keithley's 2010 Test & Measurement Product Catalog CD is available on request at http://www.keithley.info/catalogcd10.

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