The technical seminars in the Simplified Test Toolkit CD are informative and easy-to-understand and cover topics such as:
Software-Defined Radio Architecture and Next-Generation RF Instrumentation Meeting New Challenges in Wafer Level Reliability Testing Making Successful Electrical Measurements on Nanoscale Materials and Devices Advances in Testing: The Advantages of On-Board Test Sequencing
The Simplified Test Toolkit CD also includes technical presentations on Keithley’s powerful test and measurement systems, including the Series 2600 SourceMeter® Instruments, the Model 4200-SCS Semiconductor Characterization System with Pulse I-V capabilities, Series 3400 Pulse/Pattern Generators, and the Models 2810 RF Vector Signal Analyzer and 2910 RF Vector Signal Generator. Users can also request individualized configuration assistance from Keithley’s application engineers, as well as a quote on any of Keithley’s test and measurement products or systems.