Free technical Web Seminar from Keithley explores Fundamentals of Ultra-Fast I-V Device Characterization

To register for this event, which will be broadcast at 15:00 Central European Summer Time (CEST), visit http://www.keithley.info/ultrafastIVa.

Ultra-Fast Current-Voltage (I-V) testing, which includes pulsed I-V, transient I-V, and pulsed sourcing testing, is of increasing importance in the development of new semiconductor materials, processes, and devices. Common applications include non-volatile memory devices (NVM) such as Flash and phase change memory, isothermal characterization on silicon-on-insulator (SOI) devices and compound semiconductors, and transient characteristics of new materials such as high-K dielectrics.

“Fundamentals of Ultra-Fast I-V Device Characterization” will cover a core description of the measurement hardware and setups, including cabling to a probe station. The webinar will also discuss typical uses and test setups as well as common error sources. Finally, some practical examples of device measurements will be given.

This seminar is recommended for students, researchers, and engineers involved in the characterization of materials, processes, and devices. It will also be useful for lab managers wanting to learn about this measurement technique and engineers doing device and material reliability studies (WLR, ESD, latchup, etc.).

About the Presenter
“Fundamentals of Ultra-Fast I-V Device Characterization” will be presented by Lee Stauffer, Senior Staff Technologist for Keithley Instruments’ Semiconductor Measurements Group based in Cleveland, Ohio. Prior to joining Keithley, Stauffer’s career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.

Registration Information

“Fundamentals of Ultra-Fast I-V Device Characterization” will be broadcast on Thursday, April 29, 2010 at 15:00 CEST (1 p.m. GMT). The event is free to the public, but participants must register in advance at http://www.keithley.info/ultrafastIVa.