Test & Measurement
Free Keithley Web-Based Seminar Illustrates Best Practices for On-Wafer Probing
Keithley Instruments will broadcast a free, web-based seminar titled “Tips, Tricks, and Traps for On-Wafer Probing” on Thursday, January 28, 2010. This one-hour seminar will demonstrate the best practices for on-wafer probing and how to identify and solve common problems. To register for this event, which will be broadcast at 15:00 CET for the European audience, visit http://www.keithley.info/probingtips.
Test· The benefits of using Keithley-supplied cables and accessories to perform DC, CV, and ultra fast and pulsed IV measurements; · Proper grounding and guarding techniques;
· Selecting the proper types of interconnect cables;
· How to troubleshoot interconnect problems.
The event will conclude with a text-based Q&A session. Tips, Tricks, and Traps for On-Wafer Probing is recommended for test engineers and test engineering managers who have a basic understanding of wafer probing. The content is appropriate for engineers working with on-wafer devices. Dave Rose, a senior staff applications engineer at Keithley in Cleveland, Ohio, will present the seminar. Rose joined Keithley in 1987 and has spent roughly half of his career in design engineering and the other half in applications engineering.
Registration Information Tips, Tricks, and Traps for On-Wafer Probing will be broadcast on Thursday, January 28, 2010 at 15:00 CET for the European audience. The event is free to the public, but participants must register in advance at http://www.keithley.info/probingtips. The seminar will also be archived on Keithley’s website for those unable to attend the the original broadcast.