Rohde & Schwarz has announced the Power Electronics Online Conference ‘From Design to Validation’. The free online event, which takes place 5-6th May, brings together experts from industry and academia to discuss reliable measurement and validation methods for modern power electronic systems — from discrete components to grid-connected converters.
The programme opens on 5th May with a keynote by Tobias Keller (Hitachi Energy) entitled ‘Power Semiconductors: Shaping the Future Power Grid – Performance and Reliability for Future Decades’. He will discuss the qualification of silicon and silicon carbide (SiC) devices for high-voltage grid applications, focusing on thermal cycling, short-circuit robustness, and long-term reliability data.
A second keynote, delivered on 6th May by Veit Hellwig from Infineon Technologies, will examine the impact of gallium-nitride (GaN) technology on high-voltage motor inverter topologies.
In addition to the keynotes, the conference comprises a series of technical sessions. One presentation will analyse passive component characterisation, highlighting methods for extracting parasitic inductance and capacitance at frequencies above 100MHz and demonstrating the influence of these non-idealities on converter stability.
Another session will detail automated dynamic characterisation of SiC and GaN power devices, showing how double-pulse test rigs can be synchronised with high-speed digitisers to reduce measurement uncertainty and to capture fast recovery behaviour.
Electromagnetic compatibility topics are covered in two dedicated talks. The first provides practical guidance on the use of near-field probes for pinpointing radiated emission sources and for validating the effectiveness of EMI filter designs.
The second demonstrates a complete conducted emission measurement workflow on a small-scale prototype, using a Line Impedance Stabilisation Network (LISN) together with a modern mixed signal oscilloscope. The presenter will also outline a filter design methodology that exploits the time frequency capabilities of the instrument.
A further webinar addresses the growing need for accurate efficiency measurement in data centre and AI server power supplies.
By employing precision power analysers capable of tracking distorted waveforms and rapid load transients, participants will learn how to obtain true input and output power values that satisfy 80 PLUS certification requirements.
The last session focuses on harmonic current and voltage flicker compliance for low-voltage, grid-connected products. The speaker will review the limits and test procedures defined in IEC/EN 61000-3-2/-3-3 and IEC/EN 61000-3-12/-3-11, and will demonstrate how integrated compliance testing software linked to a power analyser can deliver automated pass/fail decisions from early prototype evaluation through to final type approval.
Speakers include subject matter experts from Rohde & Schwarz, Hitachi, Infineon, PE-Systems, Würth Elektronik and the Universities of Bremen and Zaragoza. Their contributions combine academic insight with industrial experience, providing attendees with both theoretical background and hands-on measurement strategies.
The conference is free of charge, but registration is required. The full agenda, speaker biographies, and the registration portal are available at: http://www.rohde-schwarz.com/power-electronics-conference
