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Peregrine Semiconductor Extends RF Performance to Test Equipment Applications

18th June 2008
ES Admin
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Peregrine Semiconductor Corporation today announced the new PE42552 SPDT 50-Ohm RF Switch, designed for use in Test and Measurement applications requiring ultra-linear RF performance and ultra-fast settling time, such as Automated Test Equipment, RF/IF transceiver signal switching, filter bank switching and discrete DSA stages.

Integrated CMOS control logic, driven by a single-pin, low-voltage CMOS control input, features a novel user-defined logic table. Further, the device includes a logic-select pin which inverts logic polarity for back-to-back switching applications, changing the logic definition of the control pin. The PE42552, designed on Peregrine’s HaRP™-enhanced UltraCMOS silicon-on-sapphire process technology, maintains excellent broadband RF performance from 9 kHz up to 7.5 GHz without gate lag and phase drift, and ensures fast switch-settling time. This innovative feature of the UltraCMOS process provides best-in-class linearity and superior performance to GaAs with the economy an integration of conventional CMOS.

The PE42552 delivers the industry’s fastest settling time and the highest linearity performance available in a RF broadband solid state switch making the PE42552 a tremendous tool for extreme performance environments such as the test equipment market.

The PE42552 exhibits outstanding isolation of 47 dB (3.0 GHz) and approaching 30 dB at 7.5 GHz; high ESD tolerance of 1.0 kV HBM on all ports; and IIP3 of +65 dBm.

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