The new Pull-Thru adapters are designed to improve the integration quality and seamless combination of structural test technologies with functional test in volume manufacturing.
As well as the actual JTAG signals, the new Pull-Thru adapter offers additional connections for GOEPEL electronic’s dynamic I/O signals for enhanced handling of all Embedded System Access (ESA) technologies.
As a result, it provides the ability to test and program highly complex boards, including on-chip flash programming, with significantly reduced test points, in some cases without the use of traditional test points or probes at all.
The new unit is fully compatible with the scalable Mass InterConnect system from VPC using Pull-Thru Receiver series G20, G20x, G40 and G14x. Using this option, users can now easily combine JTAG/Boundary Scan with the PXI Interface Test Adapter (ITA) solutions from VPC to create a high performance reliable fixture interface.