GOEPEL electronic combines Boundary Scan with analogue Opens/Shorts Tests

Using this option, dangerous solder faults can be detected before possibly leading to latent or permanent damages of the integrated circuit when operation voltage is switched on.
“The new hardware option is our reaction to the specific requirements in mission critical applications due to calculated reliability, standardised test quality and process risk minimisation,“ says Stefan Meissner, GOEPEL electronics’ Marketing and PR Manager. “In combination with the relevant software tools, users are now able to develop analogue opens/shorts tests fast and efficiently, enhancing modern test methods such as Boundary Scan, processor emulation test or chip embedded instruments. At the same time, we extend the leading position of our unique hardware platform SCANFLEX.”
The TIC02/PMU module is pin compliant to the already existing TAP Interface Card TIC02 and additionally features a powerless measurement unit (PMU). In test cases the PMU is interposed as signal source to the UUT’s native operation voltage connections, enabling opens/shorts test of the contacted nets in connection with externally switched I/O channels. A Multitude of parallel SCANFLEX I/O modules, e.g. SFX 5296 or PXI 52192 can be utilised as I/O channels.

TIC02/PMU is designed for direct build-in into a UUT fixture and can be connected to any TAP slot of a SCANFLEX® TAP Transceiver at distances of several meters. In the Boundary Scan mode the hardware works as normal TAP interface. It enables an extremely simple and backwards-compatible migration to the analogue opens/shorts test method.
The new TAP Interface Card is fully supported by the industrially leading JTAG/Boundary Scan software platform SYSTEM CASCON™ from version 4.5.4 onwards. It also includes a Test Generator that recognises connected I/O test channels and generates parametric control sequences for the TIC02/PMU.