Corelis Offers Integrated JTAG Solution with National Instruments

High Speed Digital I/O Platform Doubles as a JTAG Controller.

Boundary-scan integration support is provided for National Instruments 655x series HSDIO
instruments, including the new PXIe-6556 model. In addition to functioning as a digital waveform
generator/analyzer for characterizing, validating, and testing digital electronics, integration with
ScanExpress tools enables these cards to connect to and control a circuit board’s JTAG Test Access
Port at voltages as low as 1.2V with test clock speeds up to 30MHz. The ScanExpress software
allows users to select NI 655x series cards through the native GUI interface or alternatively by
using LabVIEW, LabWindows/CVI, and TestStand with a DLL-based API interface.

“Our customers continue to gain awareness of the value offered by deploying boundary-scan
technology earlier in the product design cycle—both as a means to increase efficiency and to
improve the bottom line,” states Ryan Jones, Senior Technical Marketing Engineer at Corelis.
“Adding National Instruments hardware product support to Corelis software aligns well with this
Page 2 movement; NI products are already used extensively in the design, development, and test
environments. The comfort, convenience, and peace of mind in using familiar equipment help
engineers reduce the learning curve when employing JTAG test.”