Bizerba decides for JTAG/Boundary Scan Platform SCANFLEX for Integration into Agilent In-Circuit Tester

“Bizerba as one of the market leading companies with highest quality demands has chosen our long-term industry proven integration solution, which demonstrates the performance of our SCANFLEX® platform”, says Bettina Richter, Marketing Manager at GOEPEL electronic. “By the integration package’s cross compatibility there’s the opportunity to transfer already developed and verified test and ISP routines directly into the production process. Supporting the entire product life cycle not only increases the whole process efficiency but cuts costs.”



“We now have the opportunity to achieve a nearly 100% test coverage on highly integrated PCBs, on which no test points can be set. Even at PCBs, where there’d be enough space for test points, they could be saved where there’s Boundary Scan access”, says Eugen Sailer, responsible for In-Circuit Test at Bizerba. “Error messages are integrated into our Agilent 3070 error ticket and saved, i.e. the existing infrastructure can be applied with Agilent-PC_Repair.”



“SCANFLEX® is already utilised at the implementation of the initial batch. Flashes and CPLDs can be programmed without an extensive Agilent3070 test adapter“, adds Michael Schaudt, responsible for Functional and Boundary Scan tests. “The Boundary Scan test development needs to be only done once and then merged with the Agilent 3070 tests as soon as the adapter’s available.”



The integrated SCANFLEX® hardware SFX-TAP4/3070-PIC supports four parallel, independent TAP with a maximum TCK frequency of 50MHz. Furthermore, various add-on resources such as dynamic 32bit PIO and handshake signals are available. All signal pins are completely integrated in the native interface of the ICT fixture transceiver, and can be programmed in a multitude of parameters. That means high signal integrity also at complex applications.



In terms of software, a run time version of the JTAG/Boundary Scan program package CASCON GALAXY® is utilised. The fault diagnostic is executed online and transferred into the ICT protocol.



In addition to IEEE Std. 1149.1, the integration package supports numerous additional test and program standards as well as the dynamic emulation test via VarioTAP® technology.