These test solutions along with other cellular, navigation and wireless connectivity solutions from NI, help engineers thoroughly test their devices on a single high-performance platform.
“Using the software-designed vector signal transceiver and the WLAN measurement suite, we improved our test speeds by more than 200 times compared to traditional rack-and-stack instruments while also significantly improving test coverage,” said Doug Johnson, Director of Engineering at Qualcomm Atheros.
Product Features:
• Ideal for characterisation and production test with best-in-class RMS EVM of -46 dB for 256 QAM
• Ability to perform measurements and custom algorithms in the onboard FPGA of the NI PXIe-5644R VST for faster measurements and real-time test