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AOI helps Wilson Process Systems improve quality and yield

8th July 2010
ES Admin
0
Wilson Process Systems is increasingly relying on automated optical inspection methods to reduce defects and improve yield with the ever-more complex PCB assembly work the company is undertaking.
Commented WPS’ Sales Director, Nick Jones: “Visual inspection methods alone are often not enough, so we have invested in the Vantage S22 Post Reflow AOI System from Orbotech to guarantee the quality of our assemblies and provide our customers with a greater peace of mind”.

With an inspection speed of up to 20cm²/sec, the Vantage S22 system is designed to detect the presence and absence of components and verify placement accuracy and polarity. The unit can also detect insufficient or excess solder, tomb-stoning, bill-boarding, co-planarity, lifted leads and shorts. Additionally, the automated record keeping and SPC capabilities of the new AOI system provide even greater confidence for verification and process control purposes. Intuitive defect reporting through a separate verification station ensures a fast, accurate repair cycle, and closed loop process control is achieved through Orbotech’s Advisor products, allowing true process capability measurement, SPC and effective process management. AOI libraries, programs and inspection results are centrally located and AOI data can be accessed remotely and across multiple platforms and sites.

Adds Jones: “By using the new AOI system in our production flow, not only do we find defects, we can also prevent them from happening in the first place. The results are higher quality, increased yields and improved operational efficiency with lower production costs. More, because Vantage S22 is so versatile, we can use it for small batch production runs.”

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