PFC controller simplifies conduction mode designs
Scalable signal switching for semiconductor test at Microelectronics UK

Scalable signal switching for semiconductor test at Microelectronics UK

Scalable signal switching for semiconductor test at Microelectronics UK Scalable signal switching for semiconductor test at Microelectronics UK

Pickering Interfaces will showcase its range of industry-standard modular signal switching solutions for semiconductor test and verification, as well as its recently launched graphical design tool, Test System Architect, developed to simplify signal switching and cabling system design, at stand E42 at Microelectronics UK, taking place from 29-30th September at ExCeL London.

Microelectronics UK is a leading event for the UK microelectronics ecosystem, bringing together professionals across design, R&D, advanced manufacturing, and testing – spanning semiconductors, photonics, and embedded systems.

“At Pickering, we provide highly specialised switching solutions designed to meet the rigorous demands of semiconductor testing,” said Steve Edwards, Head of Product Management at Pickering. “Our systems support applications such as wafer acceptance testing, high pin-count package validation and photonics testing, delivering precise signal routing, low leakage, and scalable architectures that integrate seamlessly into complex test environments.”

At the show, Pickering will highlight a range of switching solutions for semiconductor test, including:

  • High-density matrix switching: LXI reed relay plug-in matrix (65-221) for LXI scalable chassis, featuring a dual 128 x 4 configuration, originally developed for semiconductor applications such as parametric testing
  • Maximised isolation resistance, up to 1012Ω: LXI switched guard plug-in matrix for LXI scalable chassis, ideal for applications that require precise, low-level measurements, such as semiconductor test
  • Highest crosspoint density: 12-slot BRIC PXI matrix (40-558) using instrumentation-quality reed relays, part of a range of ultra-high-density large PXI matrices to suit all high-performance matrix requirements
  • 7-slot LXI/USB modular chassis (60-102): fully compliant with LXI standard, allowing 3U PXI switching and simulation modules to be remotely controlled via USB or in an Ethernet LXI environment
  • Test system design software: Test System Architect, a free online graphical tool that enables engineers to design, configure and visualise complete signal paths before deployment, reducing development time and minimising errors

Also featured will be solutions from Pickering’s reed relay and connectivity divisions.

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Power-factor correction controller simplifies conduction mode designs

PFC controller simplifies conduction mode designs