VNA covers 70kHz to 220GHz measurements in single sweep

By offering this frequency coverage, the new VectorStar VNA allows engineers to more accurately and efficiently characterise devices over a much broader range of frequencies to provide accurate device models, thus optimising the chance for accurate simulations and opportunity to reduce design turns.

The ability to provide this single sweep broadband coverage for improved device modelling is achieved because the VectorStar VNA system incorporates the Anritsu Non-linear Transmission Line (NLTL) millimeter-wave (mmWave) modules.

This design allows the 220GHz probe to connect directly to the mmWave module for accurate, stable on-wafer measurements, thereby avoiding the limits of coaxial connectors at sub-terahertz frequencies. The test platform can go beyond traditional boundaries in a single sweep

without the need to reconstruct the wafer probe station from 110GHz to higher waveguide bands. Because of the design, engineers can measure a wide range of circuits on the same wafer without transferring from a coax microwave VNA to coax mmWave VNA or waveguide mmWave VNA.

The system reduces measurement time of the entire wafer, improves measurement accuracy of wideband devices by eliminating the need for waveguide concatenation, and delivers wafer probe station cost efficiencies by reducing the number of VNA reconfigurations.

The ME7838G addresses the market need to conduct on-wafer measurements that span into the upper mmWave frequencies for more accurate device characterisation.