Multi-channel AWGs deliver 16-bit resolution

Applications include timing analysis of multi-voltage power rails; multi-sensor simulations in the automotive market; component/semiconductor test; aerospace/defense; and physics, research, and university lab settings.

Further, users can sync up to four (4) eight-channel AWGs to form a high-density channel solution of up to 32 channels.

Waveform generators with high signal accuracy and precise waveform details are key elements in designing quality end products with shorter design cycles.

By virtue of High Definition 16-bit vertical voltage resolution, the T3 AWGs produce the industry’s highest accuracy waveforms with clean, crisp details. As a result, users gain test efficiency and increased confidence in the reliability of the results.

The AWGs offer 16 bits of vertical voltage resolution, an output voltage window of up to ±24 V, and waveform memory of up to 1GS/channel.

With frequency ranges of 250MHz and 350MHz, the High Definition AWGs serve as arbitrary function generators, digital pattern generators, or AWGs.

“These 4 and 8 channel high definition AWGs offer the unique capability of combining high resolution signal generation with an output voltage range of 12V_pp (50Ω output into 50Ω input) that is further enhanced by the ability to shift the offset to ±6V,” said Roberto Petrillo, GM, Teledyne Test Tools.

Additionally, when driving waveforms from a 50Ω output into high impedance, the voltage output window widens to ±24V. This represents a huge advantage in generating MOSFET gate-drive pulses in automotive and power-semiconductor test applications.

In a stimulus-response test scenario, the AWG applies a stimulus to the DUT’s input while the oscilloscope analyses the response at the DUT’s output.

Teledyne LeCroy’s High Definition AWGs pair with its High Definition oscilloscopes in the following ways:

• Clean signals: The AWG delivers a pristine stimulus so that the DUT’s response behavior is unaffected by distortion
• Real-world signals: The AWG output comprises playback of previously acquired real-world signals from its waveform memory
• Stress-test signals: The AWG emulates problematic or corner-case inputs to the DUT
• Noise/interference immunity: The AWG emulates expected interference signals to its output to test the DUT’s response behaviour.