Anritsu Corporation announced its demonstration with the Samsung Electronics LTE USB Modem at Barcelona Mobile World Congress (MWC) from the 15th to 18th February 2010.
LTE is the next-generation, high-speed, mobile wireless technology planned for rollout from 2010 by the world’s leading operators. Anritsu has been working with Samsung Electronics, as a primary test vendor, to help prove its LTE capable devices.
Anritsu and Samsung Electronics have been jointly testing Samsung’s world-leading LTE device. Together they have already achieved excellent results, such as demonstrating 100 Mbps (downlink) and 50 Mbps (uplink) data throughput, and obtaining R&TTE validation, Europe’s radio regulatory requirement, using Anritsu’s LTE radio frequency conformance test system.
At the MWC Anritsu will be demonstrating its LTE solutions, including the MT8820C Radio Communication Analyzer, a next generation One Box Tester, and TS36.521 RF conformance tests with the ME7873L LTE radio frequency conformance test system using Samsung’s LTE devices.
LTE Exhibits
* MD8430A LTE Signaling Tester (e-NodeB Simulator)
* RTD Rapid Test Designer (test script editing and execution software)
* ME7832L LTE Protocol Conformance Test System
* ME7873L LTE RF Conformance Test System
* MT8820C Radio Communication Analyzer
* MS2830A Signal Analyzer