Test & Measurement

Instrument upgrades enhance phase noise analysis

19th January 2023
Mick Elliott

Improved performance for phase noise analysis and voltage-controlled oscillator (VCO) measurements has been announced by Rohde & Schwarz.

Both the high end R&S FSWP phase noise analyser and VCO tester plus signal and spectrum analyser in one instrument, and the R&S FSPN dedicated phase noise analyser and VCO tester, have been upgraded.

Simultaneous hardware and software upgrades improve the market-leading performance even further, reducing noise levels and measurement times, and increasing accuracy.

Both analysers include test sequence recording functions (SCPI recorder), unique for this class of instrument.

The new hardware basis common to both phase noise analysers includes upgraded DC sources with reduced noise levels, further enhancing market-leading sensitivity.

Users will receive an improved capacitive screen featuring higher colour intensity and better antiglare properties, making the display brighter and clearer in all working conditions. In addition, multi-touch features like zoom are supported by the updated user interface.

For very low noise oscillators with the inherent noise largely thermal at wider offsets, any potential cross-spectral collapse is now suppressed.

In production environments, higher measurement speed for VCO measurements will help reduce the cost of test.

With the newly introduced SCPI command recorder Rohde & Schwarz implements for the first time a function with phase noise measurement equipment to record sequences of manual settings.

Using the command recorder, engineers can create easily repeatable test sequences, including the necessary synchronisation to operate correctly.

The updated R&SFSPN and R&SFSWP phase noise analysers are now available from Rohde & Schwarz.

Product Spotlight

Upcoming Events

View all events
Latest global electronics news
© Copyright 2024 Electronic Specifier