Test & Measurement
Agilent Introduces Waveform Analysis Solutions for Next-Generation Storage, Telecommunications Components and Systems
Agilent Technologies has introduced three measurement solutions for testing next-generation storage and telecommunications components and systems. The new solutions are the first of their kind in the industry and are based on the 86100C digital communications analyzer (DCA). They allow engineers to easily visualize and accurately quantify the quality of their latest component and system designs.
New models expand applications for OTDR family
Six models have been added to the Yokogawa AQ7275 Series of optical time-domain reflectometers, extending its range of applications to cover virtually all metro, access and core networks as well as fibre to the home and passive optical networks.
White Paper Describes Semiconductor Characterization and Parametric Test Challenges
Keithley Instruments has published a white paper on how semiconductor characterization and parametric test solutions are evolving to keep pace with rapid changes in the semiconductor industry. The white paper, which can be downloaded at www.keithley.com/navigate, describes the emerging technology and business dynamics affecting the industry, including the growing need for vendor support.
Time switches maximise energy saving through astrological programming
Finder has launched a pair of digital weekly time switches providing a programming capability enabling switching according to local sunrise and sunset times, that are automatically calculated from user input of current date, time and either local longitude and latitude or nearest major city.
National Instruments Expands Wireless and Ethernet Data Acquisition Platform
National Instruments has announced six new wireless and Ethernet data acquisition modules and two ingress protection enclosures for remote monitoring and control in harsh environments. The new modules combine high-voltage digital I/O and IEEE 802.11b/g (Wi-Fi) or Ethernet communication to remotely monitor and control actuators such as pumps, valves and relays. Engineers and scientists can use these and other NI Wi-Fi or Ethernet devices with the...
Keithley Upgrades SCS For Solar Cell Testing, Expanded C-V Frequency Range, and Nine-Slot Chassis Support
Keithley Instruments has introduced a variety of hardware, firmware, and software enhancements to its award-winning Model 4200-SCS Semiconductor Characterization System. The Keithley Test Environment Interactive (KTEI) V7.2 upgrade includes nine new solar cell test libraries, an expanded frequency range for the system’s Capacitance-Voltage (C-V) measurement capability, and support for the company’s new nine-slot Model 4200-SCS instrument chas...
Mixed-Signal Interconnect Solution for Semiconductor Device Probers and Characterization Equipment from Keithley
Keithley Instruments has introduced what it says is the test industry’s only cabling solutions capable of handling I-V, C-V, and pulsed I-V signals with a single set of cables (patent pending). The new cabling kits are based on a patent-pending design that speeds and simplifies the process of making DC Current‑Voltage (I‑V), Capacitance‑Voltage (C‑V), and pulsed I‑V testing connections from any modern semiconductor...
HiPOT tester from Clare available in both single and three phase options
The Quad Series from Clare Instruments is said to be the first tester that can be used to HiPOT/flash test electrical products with in-built internal circuitry while they are connected to an isolated power supply. Typical products that incorporate internal circuits are microprocessor based domestic/industrial washing machines, cooking appliances, consumer audio/TV/IT products and construction machinery built to international standards such as IEC...
Agilent to Collaborate with ASTER for Seamless Test Coverage Analysis Across Test Platforms
Agilent has announced a strategic partnership with ASTER Technologies to enable integration of ASTER's TestWay Coverage Analyst with Agilent's printed circuit board assembly test platforms, enabling seamless test coverage analysis across test platforms.
Agilent's Portfolio Now Includes Industry-First Automated USB SuperSpeed Pattern Generator Calibration
Agilent has announced it has expanded its Universal Serial Bus (USB) test portfolio with the industry's first automated calibration of a USB 3.0 pattern generator required for receiver test. This enhancement will significantly reduce test system setup time and is a major step toward fully automated receiver tests.