Test & Measurement
PCI Express 5.0 Rx LEQ test system demoed at DesignCon
What is said to be the world’s first PCI Express (PCIe) 5.0 Rx LEQ Test System supporting compliance test items is being demonstrated by Anritsu and Synopsys at DesignCon 2020 in Santa Clara (January 28-30). The solution uses Anritsu’s Signal Quality Analyser-R MP1900a series PCI Express 5.0 test system and Synopsys’ DesignWare IP for PCIe.
DesignCon debut for power supply test demonstration
Quartz crystal specialist Epson and test and measurement supplier Rohde & Schwarz have jointly developed a modern test procedure for measuring power supply noise rejection to bring clarity and precision to real-world signal integrity design challenges.
43.5GHz VNA delivers enhanced measurement stability
A modular 1-port Vector Network Analyser (VNA) that supports measurement frequencies up to 43.5GHz has been introduced by Anritsu. With 8GHz and 20GHz models also available in the series, the Anritsu ShockLine MS46131A USB VNA brings cost and efficiency advantages to measuring antennas and other 1-port 5G devices at sub-6GHz, as well as in the 28GHz and 39GHz millimeter wave bands.
RF solutions for T&M applications to be showcased at DesignCon 2020
HUBER+SUHNER will showcase its latest innovative solutions to meet the ever-changing technological challenges of test and measurement applications at DesignCon 2020 in Santa Clara, California. HUBER+SUHNER will demonstrate its 70GHz test lead SUCOFLEX 570S and the MXPM90+ for multicoax measurements up to 90+ GHz at booth #1145.
Jitter option enhances oscilloscopes debugging capabilities
A new option for the Rohde & Schwarz R&S RTO and R&S RTP oscilloscopes helps development engineers gain more insight into the individual jitter components of their transmission interface. Jitter can now be separated into its random and deterministic components and view results flexibly for effective debugging.
Optical spectrum analyser allows side mode analysis of MWIR lasers
A wide band Optical Spectrum Analyser (OSA) that is claimed to unlock new possibilities for environmental sensing and medical applications has been released by Yokogawa. The AQ6377 allows side mode analysis of MWIR lasers.
Strong demands being placed on T&M equipment
Not only are electronic modules and devices becoming smaller and smaller, they also often contain multiple communications interfaces with data rates up to the Gbit/s range. And integrated components are being supplied with ever lower, tighter tolerance voltages. These are major test and measurement challenges.
Automotive linear thermistor with immunity to environmental variation
The TMP61-Q1 small silicon linear thermistors from Texas Instruments are designed for temperature measurement, protection, compensation, and control systems. Compared to traditional NTC thermistors, the TMP61-Q1 device offers enhanced linearity and consistent sensitivity across the full temperature range.
Vector network analyser swells budget instrument range
Broadening development of its Teledyne Test Tools (T3)-branded portfolio of test equipment, Teledyne LeCroy has unveiled the T3VNA1500 Vector Network Analyser. The product enhances the affordable test equipment portfolio that engineers, developers and schools can use to assemble a well-equipped test bench efficiently, reliably and within budget.
Innovative test solutions at embedded world 2020 for engineers
Tektronix will be showcasing a wide-range of test and measurement products at Embedded World 2020 (Stand 104, Hall 4), which takes place from 25th to 27th February in Nuremberg, Germany. The Tektronix products on display will address a wide range of applications.