Test & Measurement
Cloud solutions boost efficiencies for IC designs
Working with its partner PDF Solutions, Advantest has introduced two new innovative cloud-based software solutions: the Advantest V93000 Dynamic Parametric Test (DPT) system powered by PDF Exensio DPT, and an edge high performance compute (HPC) system.
Scope to cloud software enables global test data sharing
What is said to be the first native oscilloscope-to-cloud software solution to facilitate global data collaboration directly on an oscilloscope, PC, phone or tablet has been released by Tektronix.
Inspection scope averts connector issues
An inspection scope designed to vastly improve multi-fibre connector testing in data centres and other telecom networks has been released by EXFO.
CMOS image capture module tests D-PHY and C-PHY ICs
A high-speed CMOS image capture module for its T2000 test platform that enables highly parallel, 64-site testing of both D-PHY and C-PHY devices for the rapidly growing smart phone market has been introduced by Advantest.
Pickering Interfaces unveils customer support program
To ensure that customers get the support they need from the best available systems integrator in their region for their application or requirements, Pickering Interfaces has launched its Pickering Partner Program.
General-purpose hardware units compatible with T2000
Advantest has introduced two new general-purpose hardware instruments – the 500MDM digital module and the DPS32A power supply module – to boost the capabilities of its T2000 test platform for a variety of applications such as system-on-a-chip (SoC) devices, power-management ICs, automotive devices and CMOS image sensors for the growing digital transformation market.
Economy 100MHz Siglent SDS1104X-U oscilloscope
Saelig has introduced the SDS1104X-U four-channel 100MHz oscilloscope, a lower priced, economy version of the SDS1104X-E. Many excellent features have been retained, including the large 7" TFT-LCD display and ergonomic front panel design, while economies have been made by removing the optional MSO and function generator upgrade capabilities.
Probe heads advance wafer testing
Smiths Interconnect has expanded its Volta product line to incorporate Volta180 probe heads, to support the Wafer Level Packages and Known Good Dies test businesses.
Successful complete solutions from Rohde & Schwarz
With a typical engineer’s bench in mind, Rohde & Schwarz has created a new promotion, building on its successful campaign from last year. Under the motto ‘Full Bench. High Value.’ customers can purchase for a limited time an even wider selection of fully equipped entry-level T&M instruments, pre-configured with all options at competitive package prices.
Electronic loads minimise test bench space
Keysight Technologies’ EL30000 Series bench DC electronic loads offer a compact bench form factor with a built-in data logger that delivers insights for immediate, real-time decisions, and minimises the need for additional instruments with an accurate system that measures voltage, current and calculates power.