Power

Microsemi Unveil Linear POL Regulators For Space, Aviation And Defence Applications

3rd July 2013
ES Admin
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The MHL8701 and MHL8705 ultra-low dropout linear point-of-load regulators for space, commercial aviation and defence applications have been introduced by Microsemi. The first devices of their kind to do so, the radiation-hardened MHL8701 and MHL8705 regulators include an integrated single event effects filter to protect against soft errors caused by heavy ions often found in air- and space-borne applications.
The hermetically sealed regulators can be used with the company’s radiation-tolerant SoC and FPGA solutions, and are offered with space or military ratings. The MHL8701 and MHL8705 are in production and shipping to one of the world’s leading space technology companies for a new space bus architecture program.

Microsemi’s Massachusetts facility recently received Laboratory Suitability approval from the Defense Logistics Agency for enhanced low dose radiation sensitivity, total dose ionization, and SEE radiation testing in accordance with MIL-STD-883.

The MHL8701 and MHL8705 are qualified through the Microsemi Hi-Rel Qualification Level program to meet space and military requirements. The devices have attained radiation-performance levels of 300 Krad TID as per Method 1019 and a 100 Krad rating for enhanced low dose rate sensitivity. Single event testing was performed according to ASTM 1192F.

“Once again, Microsemi has applied its more than 50 years of expertise in developing high-reliability components to deliver an ‘industry first’ product for aerospace and defence applications. We are building on our success in these segments by leveraging our extensive industry knowledge, coupled with continued product and technology investments, to meet customer needs and deliver high-reliability components and system solutions at an accelerated pace.” Commented Durga Peddireddy, director of marketing for Microsemi’s High Reliability Products group.

Key Features:

o Maximum thermal resistance: 3.0 degrees C/ W
o SEE tested to 85 megaelectron-volts with no latch-up
o Ultra-low dropout voltage: 400mV @ 2.0A
o ELDRS tested to 100 Krad, with a powered performance <+/- 5 percent
o DLA Standard Microcircuits Drawing qualification in process

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