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Fujitsu Presented with Differentiation Excellence Award by Frost & Sullivan for CGI Studio
Development and Test Techniques for Embedded Systems: Register now for free Webinar from IAR Systems and LDRA
Renesas Electronics Announces New SiGe:C Heterojunction Bipolar Transistor with the Industry’s Best Low-Noise Performance for Wireless LANs and Similar Applications

Development and Test Techniques for Embedded Systems: Register now for free Webinar from IAR Systems and LDRA

Free Webinar on Tuesday, September 27, 2011, at 10:30 to 11:30 am . With embedded systems software’s growing complexity, tight budgets and high pressure on development time, project managers, system engineers and software technical leads need to optimize their processes and tools. In a free webinar IAR Systems and LDRA present tools and methodology which to successfully establish effective software processes from initial development through test and certification – on time, on budget and while reducing errors and minimizing risks.
13 September 2011
byNews Desk

The webinar will show how to
:
• establish effective software processes at minimum cost,
• achieve code compliance to a coding or certification standard,
• automate traceability between requirements, code and tests,
• design safer, more reliable and maintainable embedded software,
• minimize software testing redundancy and overkill, and
• tune code for performance and optimization

The webinar “Development and Test Techniques for Embedded Systems” is scheduled for Tuesday, September 27, 2011, at 10:30 to 11:30 am (CET).

13 September 2011
byNews Desk

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Fujitsu Presented with Differentiation Excellence Award by Frost & Sullivan for CGI Studio

13 September 2011
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Renesas Electronics Announces New SiGe:C Heterojunction Bipolar Transistor with the Industry’s Best Low-Noise Performance for Wireless LANs and Similar Applications

13 September 2011

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