Home > News & Analysis > Synopsys and GLOBALFOUNDRIES Collaborate to Deliver Interoperable Process Design Kits (iPDKs)

Analysis

Synopsys and GLOBALFOUNDRIES Collaborate to Deliver Interoperable Process Design Kits (iPDKs)

11th July 2011

Synopsys Inc

ES Admin

0 0

Synopsys, Inc. a world leader in software and IP for semiconductor design, verification and manufacturing, today announced that it has collaborated with GLOBALFOUNDRIES to jointly develop, validate, support and distribute interoperable process design kits (iPDKs) for GLOBALFOUNDRIES' mainstream and advanced process technologies. The GLOBALFOUNDRIES 65-nanometer (nm) iPDKs are available now with additional iPDKs planned for delivery later in 2011. The iPDKs have been fully validated with Synopsys' custom design solution, including the Galaxy Custom Designer® tool, HSPICE® circuit simulator, CustomSim™ circuit simulator, IC Validator physical verification tool and StarRC™ extraction tool.

Synopsys Custom Design Solution Now Supported by GLOBALFOUNDRIES 65nm Process Technologies

The iPDK collaboration with Synopsys is a continuation of our design enablement initiative, said Henry Law, vice president of technology development at GLOBALFOUNDRIES. With the delivery of iPDKs, we are able to address a broader market segment with our leading process technologies and give our customers more choices in adopting new EDA solutions such as Synopsys' Custom Designer.

Interoperable PDKs accelerate and broaden designer access to new process nodes, promote design reuse and portability, said Paul Lo, senior vice president and general manager of the Analog/Mixed-Signal Group at Synopsys. Through this iPDK collaboration, our support for GLOBALFOUNDRIES' process technology is now expanded to include Synopsys' custom design solution, in addition to what is already available for our digital implementation and IP solutions.

The GLOBALFOUNDRIES 65nm-G (generic process) and 65nm-LPe (enhanced low power process) iPDKs are available now. Please contact GLOBALFOUNDRIES for more information.