Power rail probes make debut at embedded world 2019

11th December 2018
Source: Tektronix
Posted By : Mick Elliott
Power rail probes make debut at embedded world 2019

A wide range of measurement solutions will be showcased by Tektronix at embedded world in Nuremberg (February 26-28, 2019). The Tektronix stand will feature four workstations, including demonstrations on Embedded Design, Power Electronics, Automotive Solutions and Education & Research.

Highlights include a first public outing for new power rail probes, TPR1000 and TPR 4000 with 1mv accuracy.

Designed specifically for minimizing noise on power rail measurement, these new power rail probes enable clean, ultra-low noise measurement insight, with up to 60V offset.

Combined with a 5 Series MSO or our New 6 Series MSO oscilloscope, a more accurate picture of ripple measurements are possible.

With a low-noise, in-house designed ASIC at its heart, Tektronix’s 6 Series MSO mixed-signal oscilloscope advances the performance threshold of mid-range oscilloscopes to 8GHz and delivers a 25GS/s sample rate simultaneously on all 4 channels, allowing engineers working on faster, more complex embedded systems designs to accurately view up to four high-speed signals at one time.

With usability and upgradeability at its forefront, coupled with advanced measurements capability and new probing technologies, the 6 Series MSO really delivers measurement confidence. 

New automotive-specific software solutions for the 5Series MSOmixed signal oscilloscope designed to speed up validation and debug and shorten design cycles for the complex electronics systems found in next-generation vehicles.

These new automotive solutions take full advantage of key 5 Series MSO innovations including up to 8 channels, 12-bit resolution and its massive high-definition capacitive touch display and highly intuitive user interface.

With a completely new design, the AFG31000 features many key firsts including the industry’s largest touchscreen and new user interface that will delight engineers and researchers who need to generate increasingly complex test cases for debugging, troubleshooting, characterising and validating devices under test. 

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