Companies

Teledyne LeCroy

  • 700 Chestnut Ridge Road Chestnut Ridge NY
    10977-6499
    United States of America
  • 845-425-2000
  • http://teledynelecroy.com/
  • 845-578-5985

Teledyne Relays is the pre-eminent provider of switching solutions with design, development, manufacturing and test capabilities. The comprehensive product line covers ultraminiature, hermetically sealed TO5 and CentiGrid® relays, industrial and military solid state relays, coaxial switches and coaxial switch matrix assemblies supporting a wide variety of applications. Teledyne Relays provides solutions for RF and Microwave applications in the test, instrumentation, wireless and communication markets. In addition, Teledyne Relays is internationally recognised in traditional military, aviation and space applications

Teledyne LeCroy Articles

Displaying 101 - 120 of 163
Test & Measurement
16th February 2011
LeCroy - Stand-alone DDR3 Protocol Analyzer

LeCroy Corporation, the worldwide leader in protocol test solutions, today introduced a new low-cost platform that provides comprehensive DDR3 bus and JEDEC timing analysis. LeCroy’s Kibra™ 380 is the industry's first true, standalone protocol analyzer for DDR3, combining waveform views and state listings, with dedicated trigger logic to allow improved visualization of DDR3 state transitions and protocol violations. Designed to lower the cost...

Test & Measurement
16th February 2011
LeCroy - Mid-Range Oscilloscope Platform

LeCroy today announced the launch of WaveRunner 6 Zi, its newest mid-range oscilloscope series. The new platform is the latest design in a comprehensive rollout of technology-leading products that LeCroy initiated in the fall of 2010.

Test & Measurement
16th February 2011
LeCroy Premieres Industry-Leading New Products at DesignCon 2011

LeCroy Corporation premiered an array of innovative new products at DesignCon 2011, demonstrating continued leadership in the speed, performance and analysis capabilities of oscilloscopes and signal integrity test solutions. LeCroy engineers were available for discussion on the exhibition floor, presented four technical sessions and delivered one three-hour tutorial.

Test & Measurement
8th February 2011
LeCroy - WaveRunner 6 Zi Oscilloscope Platform

LeCroy Corporation’s new line of WaveRunner 6 Zi oscilloscopes define superiority in a test instrument with a powerful feature set including a wide range of application packages, advanced triggering to isolate events, a user interface developed for quick and easy navigation, a wide range of probing options, and lightning-fast performance. The WaveRunner 6 Zi oscilloscope family features a pristine signal path that offers unmatched signal fideli...

Test & Measurement
28th January 2011
LeCroy - 200 MHz – 1 GHz WaveSurfer Oscilloscopes with Class Leading Memory and Sample Rate

LeCroy today announced the new line of WaveSurfer MXs-B and MSO MXs-B oscilloscopes ranging from 200 MHz to 1 GHz bandwidth. The new oscilloscopes deliver sample rate of up to 10 GS/s and memory of 25 Mpts, as well as feature set enhancements which include a powerful Sequence Mode data acquisition capability. The new sample rate and memory make WaveSurfer the performance leader in its class. This performance along with debug tools such as WaveStr...

Test & Measurement
4th January 2011
LeCroy's New CrossSync Capability Provides Complete End-to-End Visibility into Multi-Protocol Systems

LeCroy Corporation, the worldwide leader in protocol test solutions, today introduced a new analyzer synchronization option that enables complete end-to-end visibility into multi-protocol systems. LeCroy’s latest generation analyzer platforms can now be linked to provide time-aligned display of packet traffic from multiple high-speed serial protocols. Useful for testing systems that bridge data across different busses, this new capability lever...

Test & Measurement
16th December 2010
LeCroy Enhances LogicStudio to Include Tektronix and Agilent Oscilloscope Connectivity

LeCroy Corporation today announced a new version of its LogicStudio software that enhances the oscilloscope connectivity of the LogicStudio™ 16 providing support for not only the LeCroy WaveJet® oscilloscope but also several popular oscilloscopes from Tektronix and Agilent. This new software adds an unprecedented level of flexibility to the LogicStudio, letting users of a wide range of oscilloscopes from 40 MHz up to 1 GHz turn their PCs into ...

Analysis
7th December 2010
LeCroy and Evatronix Announce Partnership for SuperSpeed USB 3.0 Development Solutions

LeCroy Corporation and Evatronix SA have announced today the signing of a partnership agreement that aims towards a faster market adoption of the SuperSpeed USB 3.0 technology by cooperation on mutual product development and USB market investigation. Both companies have established strong leadership positions in the USB market through comprehensive portfolios and years of design experience. The partnership will now leverage this expertise and bri...

Test & Measurement
28th October 2010
LeCroy Introduces SPARQ Signal Integrity Network Analyzers

LeCroy Corporation today announced the launch of a new class of instrument, the SPARQ series of Signal Integrity Network Analyzers. The SPARQ measures 40 GHz S-parameters on up to 4-ports with single button press operation at a small fraction of the cost of traditional methods such as Vector Network Analyzers. With the low price and ease of use of the SPARQ, multi-port S-parameter measurements are now accessible to a much wider audience. The SPAR...

Test & Measurement
28th October 2010
LeCroy Demonstrating SimPASS PE On Cadence Palladium Platforms at CDNLive!

LeCroy Corporation today is presenting the SimPASS PE application at Cadence Design Systems’ CDNLive! users conference in San Jose, CA. SimPASS PE is a software application that converts vector files generated by a simulation verification platform and allows the user to view the data traffic in industry-standard CATC Trace displays. Based on the existing LeCroy graphical user interface for display and analysis of data traffic, SimPASS PE extend...

Tech Videos
22nd October 2010
LeCroy SPARQ Demo

The LeCroy SPARQ is a new class of instrument; the Signal Integrity Network Analyzer.

Test & Measurement
12th October 2010
LeCroy Introduces SPARQ Signal Integrity Network Analyzers - New Class of Instrument Measures 40 GHz, 4-Port S-Parameters for Signal Integrity Applications

LeCroy Corporation, a leading supplier of oscilloscopes, protocol analyzers and serial data test solutions, today announced the launch of a new class of instrument, the SPARQ series of Signal Integrity Network Analyzers. The SPARQ measures 40 GHz S-parameters on up to 4-ports with single button press operation at a small fraction of the cost of traditional methods such as Vector Network Analyzers. With the low price and ease of use of the SPARQ, ...

Test & Measurement
12th October 2010
LeCroy Claims Clear Oscilloscope Leadership

LeCroy Corporation's new line of WaveMaster 8Zi-A digital oscilloscopes, Serial Data Analyzers, and Disk Drive Analyzers—the 8 Zi-A Series—now provides up to 45 GHz of bandwidth and 120 GS/s of sample rate – the world's highest bandwidth and fastest sample rate real-time oscilloscope – combined with 768 Megapoints of analysis memory. Additionally, the introduction of a model with 20 GHz bandwidth on four channels provides the highest perf...

Test & Measurement
29th September 2010
LeCroy launches the World's Fastest Oscilloscope !

LeCroy Corporation’s new line of WaveMaster 8Zi-A digital oscilloscopes – the 8 Zi-A Series – now provides up to 45 GHz of bandwidth and 120 GS/s of sample rate – the world’s highest bandwidth and fastest sample rate real-time oscilloscope – combined with 768 Megapoints of analysis memory. Additionally, the introduction of a model with 20 GHz of true analog bandwidth on four channels provides the highest performance and signal fidelit...

Test & Measurement
14th September 2010
LeCroy - ExpressCard 2.0 Interposer for PCI Express 2.0 Analysis

LeCroy Corporation, a leading supplier of oscilloscopes and serial data test solutions, today introduced a new ExpressCard 2.0 Interposer for the Summit PCI Express Protocol Analyzer product line. This new ExpressCard 2.0 Interposer is a dedicated probe that makes it easier to analyze data traffic from an ExpressCard interface (designed to insert into an ExpressCard slot in a notebook or tablet system). The ExpressCard standard was developed by ...

Test & Measurement
14th September 2010
LeCroy Redefines Serial Data Decode and Debugging for Oscilloscopes

LeCroy Corporation today strengthened its powerful portfolio of decode options with the addition of six new serial data decoders - ARINC 429, USB 2.0, MIPI D-PHY (including CSI-2 and DSI) and DigRF 3G decoders. Additionally, a new PROTObus MAG (Measure, Analysis, Graph) Serial Debug Toolkit is also now available. PROTObus MAG augments the I2C, SPI, UART, RS-232, CAN, LIN, FlexRay, DigRF 3G, and MIL-STD-1553 decoders and contains a variety of data...

Test & Measurement
14th September 2010
LeCroy Announces Industry’s Most Comprehensive MIPI Test Solutions

LeCroy, a leading supplier of oscilloscopes, protocol analyzers and serial data test solutions, today announced the industry’s most comprehensive testing solutions for the mobile phone industry specifically targeted to MIPI (Mobile Industry Processor Interface) standards. The MIPI standards are driving the next generation of mobile devices - allowing for faster data transfer, lower power consumption, and higher resolution displays and cameras. ...

Tech Videos
1st September 2010
LeCroy PCIe Summit T3-16 Intro Presentation

LeCroy Summit T3-16 PCI Express Protocol Analyzer Intro Presentation

Test & Measurement
9th July 2010
Digital Signal Processing in Oscilloscopes

The oscilloscope is the primary tool used by hardware design and test engineers. Understanding how DSP is used in modern digital oscilloscopes is key to understanding the performance advantages that can be obtained, and avoiding the pitfalls of poor implementations.

Test & Measurement
9th July 2010
Timing Measurement Problems and Solutions in Source Terminated Memory Systems with Inaccessible Probing Points

This paper discusses the common problem of making setup and hold measurements in memory systems where the desired probing point is inaccessible. Timing measurement problems of this type are problematic not only in skew due to incorrect probing locations, but also due to waveform distortions due to reflections created by various termination schemes.

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