National Instruments

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National Instruments articles

Displaying 1 - 20 of 584

4GHz vehicle radar test system delivers reliability

4GHz vehicle radar test system delivers reliability
A 4GHz Vehicle Radar Test System (VRTS) has been released by NI. It was demonstrated at NIDays in Munich on November 20. Automotive radar is essential to vehicle safety for current advanced driver assistance systems (ADAS) and future autonomous driving.
16th November 2019

mmWave transceiver system drives 6G research

mmWave transceiver system drives 6G research
A real-time sub THz software-defined radio (SDR) for 6G research is built on NI’s mmWave Transceiver System (MTS) and Virginia Diodes’ (VDI) radio heads. Using VDI radio heads, the frequency range of the MTS can extend into the sub THz range.
23rd October 2019

EuMW 2019: Wi-Fi 6 PA components get 6GHz test coverage

EuMW 2019: Wi-Fi 6 PA components get 6GHz test coverage
European Microwave Week in Paris provided the platform for NI to announce a Wi-Fi 6 Front-End test reference architecture for comprehensive, accurate and fast testing of the latest Wi-Fi 6 power amplifiers (PAs) and front-end modules (FEMs) operating in new frequency bands above 6GHz.
1st October 2019


Software update enhances semiconductor test system

Software update enhances semiconductor test system
Semiconductor Test System software enhancements that deliver significant improvements to the programming and debugging experience, test execution speed, parallel test efficiency and overall equipment efficiency have been unveiled by NI.
13th September 2019

Favre to head up National Instruments semiconductor biz

Favre to head up National Instruments semiconductor biz
Ritu Favre has been named as senior vice president and general manager of National Instruments’ semiconductor business. In this role, Favre will set the strategic direction to drive business growth and build on the company's momentum in the industry. 
3rd September 2019

Vector signal transceiver cuts SATCOM design costs

Vector signal transceiver cuts SATCOM design costs
The PXIe-5831 vector signal transceiver (VST) from NI has been developed to further address time-to-market challenges for X-band, Ku-band and Ka-band radar and satellite communications (SATCOM) components and systems.
5th June 2019

NI Week 2019: Teaching solution extends into analogue

Updates to its university-level teaching solution, the NI Educational Laboratory Virtual Instrumentation Suite (NI ELVIS) III have been released by NI at NIWeek 2019 in Austin. New application boards and upgraded software for NI ELVIS III provide a modernised, simpler interface for students to take measurements using industry-standard hardware even faster.
22nd May 2019

NIWeek 2019: 5G mmWave wafer test probe solution demoed

A 5G mmWave wafer probe test solution developed by NI in collaboration with Tokyo Electron (TEL), FormFactor and Reid-Ashman has been demonstrated at NIWeek 2019 in Austin. Addressing the technical challenges associated with 5G mmWave wafer probe test, the solution can help semiconductor manufacturers reduce their risk, cost and time to market for 5G mmWave ICs.
21st May 2019

NIWeek 2019: Software's single interface accelerates test setup

The latest version of NI’s SystemLink software was released at NIWeek 2019 in Austin. It has been developed to ease the daunting task of managing configuration activities and data for a fleet of distributed test and measurement systems, especially when systems incorporate a variety of device configurations and software combinations.
21st May 2019

NIWeek 2019: Software enhances developers productivity

As is traditional at NIWeek, NI unveiled the latest release of its LabVIEW systems engineering software. The latest release of LabVIEW 2019 increases developer productivity through improved visibility in the IDE, powerful enhancements in debugging, and new datatypes to the G-language.
21st May 2019

Software release simplifies time-consuming test tasks

A new release of LabVIEW NXG has been unveiled by NI. It simplifies time-consuming tasks in automated test and automated measurement applications, from setting up and configuring systems to developing test and measurement code and creating web-ready applications. These enhancements should help engineers meet challenging time-to-market requirements.
29th November 2018

Report charts engineering trends and challenges

Report charts engineering trends and challenges
A report which examines the most crucial engineering trends and challenges of the changing technology landscape, including the Internet of Things (IoT), the progression of 5G technology from prototyping to commercial deployment and autonomous driving for the masses has been released by NI. 
5th November 2018

PXIe transceiver enables direct RF sampling

PXIe transceiver enables direct RF sampling
An FPGA-enabled PXIe-5785 FlexRIO transceiver, which aims to shorten the design cycle for advanced radar applications in aerospace and defence has been released by NI. Advances in the use of the electromagnetic spectrum continue to drive military electronics to stay ahead of emerging threats.
8th October 2018

Software featured at EDI CON 2018

Software featured at EDI CON 2018
On display in Booth #212 at the 2018 Electronic Design Innovation Conference and Exhibition (EDI CON) USA, taking place October 17th to 18th in Santa Clara, CA, will be new National Instruments AWR software. Booth demonstrations will highlight the V14 release of NI AWR Design Environment platform.
1st October 2018

Software shortens debugging of automated test systems

Software shortens debugging of automated test systems
InstrumentStudio software for NI PXI modular instruments made its bow at NIWeek in Austin. InstrumentStudio improves the live, interactive use model for modular instruments and makes debugging while running tests more intuitive. Engineers in the aerospace, automotive and semiconductor industries benefit from a more effective workflow for test system development.
28th May 2018

NIWeek 2018: ELVIS III prepares students for industry challenges

NIWeek 2018: ELVIS III prepares students for industry challenges
More and more companies need newly-employed graduates to be “game-ready” to take up their tasks as they enter industry. That’s a challenge that National Instruments is looking to meet with the launch of ELVIS III, or to put it slightly more prosaically the Educational Laboratory Virtual Instrumentation Suite III.
22nd May 2018

NIWeek 2018: LabVIEW 2018 speeds time to market

NIWeek 2018: LabVIEW 2018 speeds time to market
Buttressed by customer feedback which revealed 72% want a test and measurement solution tailored to their needs, National Instruments (NI) unveiled LabVIEW 2018 at NIWeek in Austin, Texas. “The only trends are megatrends”, was the opening proclamation from Luke Schreier, Vice President, Automated Test Product Management and Global Marketing Strategy as he unveiled the latest version of the company’s LabView engineering test software, LabVIEW 2018.
22nd May 2018

Application software aids operational efficiency

SystemLink application software for distributed systems management has been released by NI. It helps improve operational efficiency and decrease maintenance costs through a centralised interface for automating tasks such as software deployment, remote device configuration and system health performance monitoring.
9th May 2018

HIL technology moves to forefront of EV testing

Major automotive manufacturers like Subaru are using NI hardware-in-the-loop (HIL) technology to simulate actual road conditions for electric vehicle testing, eliminating environmental factors to reduce test time and costs. Traditionally, engineers have conducted vehicle tests using finished cars on test courses or public roads to check the vehicle’s performance and safety response.
23rd March 2018

Source measure unit enhances semiconductor testing

Source measure unit enhances semiconductor testing
Endeavouring to offer more efficient approaches to semiconductor test, NI has announced the PXIe-4163 high-density source measure unit (SMU), which provides six times more DC channel density than previous NI PXI SMUs for testing RF, MEMS, and mixed-signal and other analogue semiconductor components.
6th February 2018


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