NI (National Instruments)
NI (National Instruments) Articles
NI, Konrad Technologies unite on autonomous driving test
NI and Konrad Technologies (KT) have forged a strategic agreement to develop test systems and solutions for autonomous driving software and hardware validation.
NI's OptimalPlus joins the Open Manufacturing Platform
NI says that its latest acquisition, OptimalPlus, has joined the Open Manufacturing Platform (OMP), a consortium led by BMW, Microsoft, ZF, Bosch and ABInBev that helps manufacturers leverage advanced technologies to gain greater operational efficiencies, factory output, customer loyalty and net profits.
NI, SET, Tech180 collaborate on disruptive test strategy
NI, SET GmbH and Tech180, all three experts in aerospace and defense test systems, are collaborating to disrupt how test systems are designed, developed, and maintained.
Software smooths path to seamless test operation
To standardise the way data is shared and analysed, NI’s new enterprise version of its SystemLink software enables increased visibility and control of test systems across an entire organisation.
Engineer Ambitiously is new-look NI's clarion call
A new brand, a new logo and a call to engineers who are standing tall in these uncertain time to stand taller. Unveiled today is NI, formerly National Instruments, and a new approach to the test and measurement market dubbed “Engineer Ambitiously”.
NI announces free editions of LabView software
National Instruments (NI) is opening up free access to its LabView and LabView NXG platforms for free non-commercial use to hobbyists.
EV HIL test solutions to feature at NIDays in Munich
New solutions for hardware-in-the-loop (HIL) validation of electric vehicle (EV) powertrain components have been released by NI. They will be demonstrated at NIDays in Munich on November 20. Government mandates for lower emissions and higher efficiency are increasing pressure on automakers to get EVs to market as quickly as possible.
4GHz vehicle radar test system delivers reliability
A 4GHz Vehicle Radar Test System (VRTS) has been released by NI. It was demonstrated at NIDays in Munich on November 20. Automotive radar is essential to vehicle safety for current advanced driver assistance systems (ADAS) and future autonomous driving.
mmWave transceiver system drives 6G research
A real-time sub THz software-defined radio (SDR) for 6G research is built on NI’s mmWave Transceiver System (MTS) and Virginia Diodes’ (VDI) radio heads. Using VDI radio heads, the frequency range of the MTS can extend into the sub THz range.
EuMW 2019: Test times cut for 5G mmWave OTA validation
A hardware-accelerated 5G mmWave OTA Validation Test reference architecture for thorough characterisation and validation of 5G mmWave beamforming AiP devices was unveiled by NI at European Microwave Week in Paris (October 1-3).
EuMW 2019: Wi-Fi 6 PA components get 6GHz test coverage
European Microwave Week in Paris provided the platform for NI to announce a Wi-Fi 6 Front-End test reference architecture for comprehensive, accurate and fast testing of the latest Wi-Fi 6 power amplifiers (PAs) and front-end modules (FEMs) operating in new frequency bands above 6GHz.
Test system speeds up C-V2X communication
The S.E.A. C-V2X Open Loop Test System from NI leverages 5G wireless cellular technology to provide high bandwidth and low latency communication for Vehicle-to-Vehicle (V2V) and Vehicle-to-Infrastructure (V2I) communications.
Modular solution tests the brains of autonomous vehicles
A solution to test the computing platform for autonomous vehicles (AVs) has been released by NI. AVs are complex systems to test. At the heart of the AV is a powerful computing platform that analyses the environment around the vehicle and determines the appropriate action to help ensure the safety of the car and its surroundings.
Software update enhances semiconductor test system
Semiconductor Test System software enhancements that deliver significant improvements to the programming and debugging experience, test execution speed, parallel test efficiency and overall equipment efficiency have been unveiled by NI.
Favre to head up National Instruments semiconductor biz
Ritu Favre has been named as senior vice president and general manager of National Instruments’ semiconductor business. In this role, Favre will set the strategic direction to drive business growth and build on the company's momentum in the industry.
mmWave 5G IC makers get test solution
A quad-site mmWave 5G packaged test solution developed in collaboration with Tessolve and Johnstech was demonstrated by NI at the International Microwave Symposium in Boston. Addressing the technical challenges associated with 5G mmWave package part test, this solution helps reduce the time to market for manufacturers of mmWave 5G ICs.
Vector signal transceiver cuts SATCOM design costs
The PXIe-5831 vector signal transceiver (VST) from NI has been developed to further address time-to-market challenges for X-band, Ku-band and Ka-band radar and satellite communications (SATCOM) components and systems.
NI Week 2019: Teaching solution extends into analogue
Updates to its university-level teaching solution, the NI Educational Laboratory Virtual Instrumentation Suite (NI ELVIS) III have been released by NI at NIWeek 2019 in Austin. New application boards and upgraded software for NI ELVIS III provide a modernised, simpler interface for students to take measurements using industry-standard hardware even faster.
NIWeek 2019: 5G mmWave wafer test probe solution demoed
A 5G mmWave wafer probe test solution developed by NI in collaboration with Tokyo Electron (TEL), FormFactor and Reid-Ashman has been demonstrated at NIWeek 2019 in Austin. Addressing the technical challenges associated with 5G mmWave wafer probe test, the solution can help semiconductor manufacturers reduce their risk, cost and time to market for 5G mmWave ICs.
NIWeek 2019: Software's single interface accelerates test setup
The latest version of NI’s SystemLink software was released at NIWeek 2019 in Austin. It has been developed to ease the daunting task of managing configuration activities and data for a fleet of distributed test and measurement systems, especially when systems incorporate a variety of device configurations and software combinations.