Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “High Voltage Wafer Level Test - Tips, Tricks, and Pitfalls” on Thursday, April 14, 2011. This one-hour seminar will identify, discuss, and propose solutions for a number of challenges related to high voltage wafer level parametric test.

Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an informative poster on nanotechnology measurement tips and techniques.

Keithley Instruments today introduced the Model 2651A High Power System SourceMeter instrument, the latest addition to the company’s Series 2600A System SourceMeter family. Specifically designed for characterizing high power electronics, the Model 2651A provides the widest current range available in the industry.

Keithley Instruments, Inc. will broadcast a free online seminar titled “Mastering Low Power, Low Voltage, Low Resistance Techniques for Characterizing Graphene and other Nano Materials” on Thursday, March 24, 2011 at 15:00 Central European Time (CET).

Keithley Instruments, Inc. has assembled a collection of its most popular web tutorials and seminars in a convenient CD format.

Keithley Instruments, Inc announces “Keithley University,” a series of tutorial webcasts that cover best practices for making even the most demanding measurements.

Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has produced a series of four new tutorial videos on topics related to configuring and operating one of its most sensitive measurement instruments.

Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, is offering 20% off list price on a range of broad-purpose Test & Measurement instruments to its European customers. The offer is available for a limited period of time, starting with immediate effect and ending on April 30, 2011.

Keithley Instruments has published its 2011 Test & Measurement Product Catalog in CD form. The CD offers details and technical specifications on Keithley's general-purpose and sensitive sourcing and measurement products, DC switching, Digital Multimeters, RF/microwave switching, data acquisition solutions, and semiconductor test systems. Useful selector guides and tutorials simplify choosing the right solutions for specific applications.

Many people need to make electrical measurements but are not necessarily experts in that field. In this seminar, scientists or engineers who need to perform electrical measurements but who have little experience can learn how to go about choosing test equipment, designing a test system, or simply carrying out measurements using existing equipment.

Keithley Instruments introduced several enhancements to its line of S530 Parametric Test Systems, the most cost-effective fully automatic production parametric test solutions available to the semiconductor industry.

Keithley Instruments will broadcast a free, one-hour online seminar titled “Understanding Electrical Characterization of Printed and Organic Electronics and Materials” on Thursday, January 27, 2011 at 15:00 Central European Time (CET).

Linda Rae, executive vice president and chief operating officer of Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has begun a blog with her insights on the changing landscape in the semiconductor test industry. Rae’s initial blog topics have included: “Did the Recession Affect the Pace of Innovation?” and “Tier 1 Fabs are Consolidating. How Does that Affect Test?” The Test Poin...

Keithley Instruments today announced completion of the merger of Aegean Acquisition Corporation, an indirect wholly owned subsidiary of Danaher Corporation, into Keithley pursuant to the previously announced Merger Agreement dated September 29, 2010 among Danaher Corporation, Aegean Acquisition Corporation and Keithley.

Keithley Instruments has produced a series of 11 new tutorial videos on topics related to configuring and operating one of their most popular product types, Source-Measure Units (SMUs).

Keithley Instruments will broadcast a free, webinar titled “Fundamentals of Bias Temperature Instability and State-of-the-Art Measurement Methods” on Thursday, December 16, 2010. This one-hour presentation is designed to help reliability engineers understand and implement state-of-the-art Bias Temperature Instability (BTI) measurements using ultra-fast I-V (current-voltage) methods. The online event also features an interactive question and a...

Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced that, at its special meeting of shareholders held today, the Company’s shareholders approved and adopted the Agreement and Plan of Merger, dated as of September 29, 2010, among Danaher Corporation, Aegean Acquisition Corporation and Keithley Instruments and the transactions contemplated thereby.

Keithley Instruments, Inc., l'un des leaders mondiaux pour les tests électriques avancés et les systèmes de mesure installe sur le web un Forum prévu pour offrir à nos clients et utilisateurs un moyen centralisé pour trouver de l'aide sur ses produits et échanger des points de vue sur les applications via Internet Ce Forum, accessible sur le site http://forum.keithley.com, est modéré par des experts des Départements Instrumentation et...

Keithley Instruments is hosting a forum designed to offer customers and users of Keithley instrumentation a central location for finding product support and exchanging applications insights via the web.

Keithley Instruments, Inc will broadcast a free, web-based seminar titled “Electrical Resistivity Measurements of Bulk Materials: Conductors, Insulators, and Semiconductors” on Thursday, November 18, 2010 at 15:00 Central European Time.