With a resolution approaching 100 microstrains, the DIC solution is an optional module to Akrometrix’s AXP and PS200 shadow moiré systems.
The AXP and PS200S warpage and strain measurement systems, using both shadow moiré and digital image correlation (DIC), allow customers complete flexibility for both warpage and strain metrology on the same platform. “This modular approach substantially increases the capabilities of our systems while increasing the ROI on investments,” noted Neil Hubble, Akrometrix’s Director of Engineering.