It features improved modules for intuitive BGA inspection and voiding calculation in IC die attaches and area solderings in power electronics – even in irregular shaped regions of interest.
The phoenix x|act software is available with a Flash! Filters technology option, that provides image enhancement during live inspection tasks. It automates the filtering process of all grey scales – which are present in each X-ray image – to optimise contrast and brightness for the human eye, identifying defects faster and mor reliably.
“Available in base, operator and pro configuration for the phoenix microme|x and nanome|x systems, GE’s unique x|act software package offers CAD data-based programming capabilities, while offering a suite of intuitive, built-in software tools to make X-ray inspection easier than ever before,” said Dr. Oliver Brunke, Senior Product Manager, GE’s Measurement & Control, a GE Oil & Gas division. “New enhancements allow new and unskilled operators to gain high quality results after minimal training. Ease-of-use functions – such as intuitive sample manipulation, wizard-guided inspection modules for easy setup, instant and clear live-imaging, live Pad ID overlay for easy defect identification and automatic report generation – enable inspectors to reach a high defect coverage after very short inspection times.”