The customer decided on a comprehensive solution including an InCarrier® loader/unloader, an InStrip® and an InMEMS module for accelerometer MEMS test.
Competing against standard singulated package test and established high parallel test, the InCarrier® combines the advantages of both handling solutions. Thus, it overcomes the constraints of the strip test with respect to singulation after test and lead frame design.
InCarrier™ offers a low cost of test with its high test parallelism, and ensures a robust test handling process even for small packages. As a result, the customer is able to handle 2 x 2 mm packages more stable and reliable than on any other known test process.