During the 45-minute seminar, Keithley nanotechnology expert Jonathan Tucker will discuss basic measurement issues including how to select the right current measurement instrument, practical ways to reduce current noise in measurement setups, and how to quantify subtle sources of noise.
Aimed at students, researchers, engineers, and scientists in areas such as materials science, chemistry, nanoscience, and semiconductor device development, the seminar will also include some practical application examples and conclude with a discussion of recent innovative test equipment solutions.
Attendants of the live broadcast will have an opportunity to ask the presenter for additional insight during an interactive Q&A session.