SAS has emerged as the dominant storage interface for enterprise server environments offering scalability, improved speed and higher reliability compared to SATA or previous generation parallel interfaces. Transmitter validation and debug for 6Gb/s SAS designs requires accurate jitter and eye analysis and differential S-Parameter characterization. With the addition of 6Gb/s SAS support, the TekExpress automated test software meets the varied test demands facing everyone from silicon providers to drive manufacturers to OEM systems houses.
“High-speed serial tests have become very complex and require the use of multiple instruments that have to be properly set up and coordinated. This complexity, together with the need for speed and efficiency, is driving a strong demand for test automation software,” said Dave Slack, Marketing Manager, Technology Solutions Group, Tektronix. “In 2008, we delivered the industry’s first fully automated compliance test suite for SATA Gen-2, and now we are following that up with the industry’s first solution that automates the greatest combined breadth of SAS and SATA characterization tests.”