Test & Measurement news from Electronic Specifier

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Speed up SiC MOSFET development with X-FAB XbloX

Speed up SiC MOSFET development with X-FAB XbloX

Speed up SiC MOSFET development with X-FAB XbloX

Power

29 April 2026

Quantifying comfort and fit in wearable devices

Quantifying comfort and fit in wearable devices

Quantifying comfort and fit in wearable devices

29 April 2026

NMITE secures IET accreditation for its engineering degrees

NMITE secures IET accreditation for its engineering degrees

NMITE secures IET accreditation for its engineering degrees

29 April 2026

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Popular Searches

Trending Now

Speed up SiC MOSFET development with X-FAB XbloX

Speed up SiC MOSFET development with X-FAB XbloX

Speed up SiC MOSFET development with X-FAB XbloX

Power

29 April 2026

Quantifying comfort and fit in wearable devices

Quantifying comfort and fit in wearable devices

Quantifying comfort and fit in wearable devices

29 April 2026

NMITE secures IET accreditation for its engineering degrees

NMITE secures IET accreditation for its engineering degrees

NMITE secures IET accreditation for its engineering degrees

29 April 2026

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Tasking & LDRA announce advanced data & control coupling

Tasking & LDRA announce advanced data & control coupling

Tasking & LDRA announce advanced data & control coupling capabilities

Test & Measurement

29 October 2025

Anritsu launches virtual network measurement solution

Anritsu launches virtual network measurement solution

Anritsu launches virtual network measurement solution

Test & Measurement

29 October 2025

Microchip Technology has unveiled a new high-accuracy time transfer system capable of providing sub-nanosecond precision over long-haul optical networks, in what the US semiconductor firm describes as a breakthrough for critical infrastructure resilience.

Microchip Technology has unveiled a new high-accuracy time transfer system capable of providing sub-nanosecond precision over long-haul optical networks, in what the US semiconductor firm describes as a breakthrough for critical infrastructure resilience.

Microchip unveils sub-nanosecond terrestrial timing system to cut reliance on satellite networks

Test & Measurement

28 October 2025

Ensuring safety, reliability, and accuracy in Hipot testing

Ensuring safety, reliability, and accuracy in Hipot testing

Ensuring safety, reliability, and accuracy in Hipot testing

Test & Measurement

24 October 2025

Pickering launches MEMS-based MultiGBASE-T1 FIUs

Pickering launches MEMS-based MultiGBASE-T1 FIUs

Pickering launches MEMS-based MultiGBASE-T1 FIUs

Test & Measurement

22 October 2025

EMI filters: the first line of defence in military/aerospace electronics

EMI filters: the first line of defence in military/aerospace electronics

EMI filters: the first line of defence in military/aerospace electronics

21 October 2025

byPaige Hookway

Vector Launches cube:tap Interface for LTE-V2X

Vector Launches cube:tap Interface for LTE-V2X

Vector Launches cube:tap Interface for LTE-V2X

Test & Measurement

21 October 2025

Microchip unveils SkyWire to synchronise clocks across critical infrastructure

Microchip unveils SkyWire to synchronise clocks across critical infrastructure

Microchip unveils SkyWire to synchronise clocks across critical infrastructure

17 October 2025

Capturing the benefits of EMI shielding for screening and security equipment

Capturing the benefits of EMI shielding for screening and security equipment

Capturing the benefits of EMI shielding for screening and security equipment

Test & Measurement

17 October 2025

byPaige Hookway

ickering Interfaces will unveil a new range of MEMS-based MultiGBASE-T1 fault insertion units (FIUs) at this year’s Automotive Testing Expo North America, held from 21st to 23rd October in Novi, Michigan.

ickering Interfaces will unveil a new range of MEMS-based MultiGBASE-T1 fault insertion units (FIUs) at this year’s Automotive Testing Expo North America, held from 21st to 23rd October in Novi, Michigan.

UK test specialist Pickering debuts advanced ethernet fault insertion modules in Michigan

Test & Measurement

16 October 2025

Murata Manufacturing has expanded its engineering support in Europe and globally with the opening of an advanced electromagnetic compatibility (EMC) test laboratory in Nuremberg, Germany, as it looks to strengthen its position in the fast-evolving automotive electronics market.

Murata Manufacturing has expanded its engineering support in Europe and globally with the opening of an advanced electromagnetic compatibility (EMC) test laboratory in Nuremberg, Germany, as it looks to strengthen its position in the fast-evolving automotive electronics market.

Murata targets automotive innovation through new electromagnetic testing hub in Germany

Test & Measurement

16 October 2025

Test and measurement distributor Saelig Company has launched the Rigol MHO900 Series, a new line of high-resolution digital oscilloscopes designed to combine laboratory-grade performance with portability.

Test and measurement distributor Saelig Company has launched the Rigol MHO900 Series, a new line of high-resolution digital oscilloscopes designed to combine laboratory-grade performance with portability.

Saelig expands test portfolio with Rigol MHO900 ultra-portable oscilloscope range

Test & Measurement

15 October 2025

Compact scopes combine affordability and performance

Test & Measurement

15 October 2025

Elma Electronic has launched what it says is the industry’s first VNX+ development chassis aligned with the US military’s SOSA (Sensor Open Systems Architecture) standard, aimed at accelerating the design and testing of next-generation small form factor (SFF) computing systems for mission-critical applications.

Elma Electronic has launched what it says is the industry’s first VNX+ development chassis aligned with the US military’s SOSA (Sensor Open Systems Architecture) standard, aimed at accelerating the design and testing of next-generation small form factor (SFF) computing systems for mission-critical applications.

Elma targets defence and aerospace markets with new small form factor VNX+ development system

Test & Measurement

10 October 2025

Saelig ntroduces MSR85 reusable temperature data logger

Saelig ntroduces MSR85 reusable temperature data logger

Saelig introduces MSR85 reusable temperature data logger

Test & Measurement

10 October 2025

Pickering simplifies and accelerates BMS test

Pickering simplifies and accelerates BMS test

Pickering simplifies and accelerates BMS test

Test & Measurement

9 October 2025

Teradyne extends power semiconductors test platform

Teradyne extends power semiconductors test platform

Teradyne extends power semiconductors test platform

7 October 2025

Advantest pioneers a new era of AI-powered semiconductor testing

Advantest pioneers a new era of AI-powered semiconductor testing

Advantest pioneers a new era of AI-powered semiconductor testing

7 October 2025

Flir and Extech expand test & measurement portfolio

Flir and Extech expand test & measurement portfolio

Flir and Extech expand test & measurement portfolio

7 October 2025

Japanese semiconductor test equipment maker Advantest Corporation has launched a new software tool aimed at reducing power consumption in chip testing, as the industry faces mounting pressure to curb costs and carbon emissions.

Japanese semiconductor test equipment maker Advantest Corporation has launched a new software tool aimed at reducing power consumption in chip testing, as the industry faces mounting pressure to curb costs and carbon emissions.

Advantest launches power-optimisation software to curb energy use in chip testing

Test & Measurement

7 October 2025