The probe features an innovative plunger structure to ensure stable contact, and is offered with a choice of three tip shapes depending on the application.
Despite their miniature size, the probes can handle currents of 2A (1A for the 0.22mm diameter version). They are rated for a million operations, and feature a low contact force of 33gf – 8gf depending on the diameter.
The high frequency version is shorter, reducing the spring length and hence inductance at high frequency. This results in a very low insertion loss at frequencies of 10 – 40GHz and a reduced return loss.
The new probe complements the established XP3A. Using electroforming technology Omron has created a one piece flat and exceptionally compact probe with a thickness of just 0.06 – 0.08mm.They are rated at 0.25A. Conventional test probes consist of four parts: upper and lower plungers, barrel and spring.